게시판

124	"A New Scan Slice Encoding Scheme with Flexible Code for Test Data Compression" Keun-Soo Lee, Hyuntae Park, Hyeonuk Son and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2010) pp.217-220, Nov 2010
123	"Enhenced Redundancy Analysis for Memories Using Geometric Faults Based Search Tree" Wooheon Kang, Hyungjun Cho, and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2010) pp.225-228, 2010.11
122	"An Area Efficient Programmable Built-In Self-Test for Embedded Memories Using an Extended Address Counter" Kihyun Park, Joohwan Lee, and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2010) pp.59-62, 2010.11
121	"FiX-Compact : A New X-Tolerant Response Compaction Scheme for Fixed Unknown Logic Values" Jaeseok Park and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2010) pp.209-212, Nov 2010
120	"A NOVEL SCREEN-ABILITY ESTIMATION METHODOLOGY FOR DRAM WITH A TEST ALGORITHM SIMULATOR: FS5" Woosik Jeong, Intae Kim, Sangmin Lee, Ohan Kwon, Eunbyul Kal, Kyoungshub Lee, Huycheol Bae, Kaangchil Lee, and Sungho Kang Proceedings of ITC-CSCC 2010 pp.927?929, Jul 2010
119	"An Ant Colony Optimization Approach for the Preference-based Shortest Path Search" Seung-Ho Ok, Woo-Jin Seo, Jin-Ho Ahn, Sungho Kang and Byungin Moon Proceedings of FGCN/ACN 2009 pp.539?546, Dec 2009
118	"A Hardware-Efficent Multi-character String Matching Architecture Using Brute-force Algorithm" Seongyong Ahn, Hyejong Hong, Hyunjin Kim, Jin-Ho Ahn, Dongmyong Baek and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2009) pp.464-467, Nov 2009
117	"An Area-efficient Built-in Redundancy Analysis for Embedded Memories with Optimal Repair Rate using 2-D Redundancy" Joohwan Lee, Kihyun Park, and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2009) pp.353-356, Nov 2009
116	"An Advanced BIRA Using Parallel Sub-analyzers for Embedded Memories" Woosik Jeong, Taewoo Han and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2009) pp.249-252, Nov 2009
115	"DFT for Achieving Hybrid Transiton Delay Fault Test with Reduced Pin Count Testing" Changwon Son, Seongyong Ahn and Sungho Kang Proceedings of International SOC Design Conference (ISOCC 2009) pp.128-132, Nov 2009

[1][2][3][4][5][6][7][8][9][10] Next Page>>