2016 IEEE TVLSI Acceptance - Jooyoung Kim, etc.
Author
comsys
Date
2016-09-10 10:06
Views
1048
"Hardware-Efficient Built-in Redendancy Analysis for Memory with Various Spares" has been accepted
to IEEE Traansactions on Very Large Scale Integration System.
Congratulations to the authors, Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang.
to IEEE Traansactions on Very Large Scale Integration System.
Congratulations to the authors, Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang.