Publication - 2020 IEEE Transactions on Semiconductor Manufacturing - Sungyoul Seo, etc.
Author
comsys
Date
2020-08-31 15:55
Views
645
In August 2020,
"Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing" written by Sungyoul Seo, Young-woo Lee, Hyeonchan Lim and Sungho Kang has been published in the IEEE Transactions on Semiconductor Manufacturing, vol.33, no.3, pp.391-403.
Authors' hard work has finally paid off !
"Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing" written by Sungyoul Seo, Young-woo Lee, Hyeonchan Lim and Sungho Kang has been published in the IEEE Transactions on Semiconductor Manufacturing, vol.33, no.3, pp.391-403.
Authors' hard work has finally paid off !