2022 IEEE TVLSI Acceptance - Hayoung Lee, etc.
Author
comsys
Date
2022-02-26 22:46
Views
294
The following paper has been accepted in the IEEE Transactions on Very Large Scale Integration Systems in February 2022.
Congratulations to the authors.
Title: ECMO: ECC Architecture Reusing Content Addressable Memories for Obtaining High Reliability in DRAM
Authors: Hayoung Lee, Younwoo Yoo, Seung Ho Shin, and Sungho Kang
Congratulations to the authors.
Title: ECMO: ECC Architecture Reusing Content Addressable Memories for Obtaining High Reliability in DRAM
Authors: Hayoung Lee, Younwoo Yoo, Seung Ho Shin, and Sungho Kang