2017 ISQED Presentation
Author
comsys
Date
2017-03-27 10:08
Views
1063
In March 2017, "Off-Chip Test Architecture for Improving Multi-Site Testing Efficiency using Tri-State Decoder and 3V-Level Encoder" written by Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, and Sungho Kang, has been presented in International Symposium on Quality Electronic Design.
Congratulations to the authors.
Congratulations to the authors.