Publication - 2017 IEEE Transactions on Computers Publication - Hyunggoy Oh, etc.
Author
comsys
Date
2016-12-22 15:38
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1144
“An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time (Vol. 66, No.1, pp.38-44,
Jan. 2017)” has been published to IEEE Transactions on Computers.
Congratulations to the authors, Hyunggoy Oh, Taewoo Han, Inhyuk Choi, and Sungho Kang.
Jan. 2017)” has been published to IEEE Transactions on Computers.
Congratulations to the authors, Hyunggoy Oh, Taewoo Han, Inhyuk Choi, and Sungho Kang.