2018 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Publication - Hayoung Lee, etc.

Author
comsys
Date
2018-06-22 11:10
Views
86
In June 2018,
"Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis" written by Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang,
has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.37, no.7, pp.1473-1482.

Congratulations to the authors.