Publication - 2018 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Publication - Hayoung Lee, etc

Author
comsys
Date
2018-06-22 11:10
Views
170
In June 2018,
"Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis" written by Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang,
has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.37, no.7, pp.1473-1482.

Authors' hard work has finally paid off !