2018 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Publication - Jaeil Lim, etc.

Author
comsys
Date
2018-03-21 15:45
Views
191
In March 2018,
"Thermal Aware Test Scheduling for NTV Circuit" written by Jaeil Lim, Hyunggoy Oh, Heatae Kim, Sungho Kang,
has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.37, no.4, pp.906-910.

Congratulations to the authors.