Publication - 2022 IEEE TVLSI - Hayoung Lee, etc.
Author
comsys
Date
2022-05-30 11:28
Views
226
In May 2022,
"ECMO: ECC Architecture Reusing Content Addressable Memories for Obtaining High Reliability in DRAM" written by Hayoung Lee, Younwoo Yoo, Seung Ho Shin, and Sungho Kang has been published in the IEEE Transactions on Very Large Scale Integration Systems, vol.30, pp.781-793.
Authors' hard work has finally paid off !
"ECMO: ECC Architecture Reusing Content Addressable Memories for Obtaining High Reliability in DRAM" written by Hayoung Lee, Younwoo Yoo, Seung Ho Shin, and Sungho Kang has been published in the IEEE Transactions on Very Large Scale Integration Systems, vol.30, pp.781-793.
Authors' hard work has finally paid off !