Publication - 2022 IEEE TCAD - Youngkwang Lee, etc.
Author
comsys
Date
2022-12-23 10:08
Views
237
In December 2022,
"Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture" written by Youngkwang Lee; Donghyun Han; Sooryeong Lee; Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.42, no.1, pp.308-321.
Authors' hard work has finally paid off !
"Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture" written by Youngkwang Lee; Donghyun Han; Sooryeong Lee; Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.42, no.1, pp.308-321.
Authors' hard work has finally paid off !