14 |
"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
|
13 |
"MULTI-CORE DEVICE, TEST DEVICE AND METHOD FOR DIAGNOSING FAILURE"
|
12 |
"Matching method of diagnosing multiple stuck-at faults"
|
11 |
"Method and apparatus for reducing transition number using transition monitoring window"
|
10 |
""Method for Diagnosing Troubles in Scan Chain via Symbolic Simulation"
|
9 |
"분할된 LFSR을 이용한 저전력 결정패턴 BIST 방법 및 장치"
|
8 |
"Method and Apparatus for Reducing Number of Transitions Generated by Linear Feedback Shift Register"
|
7 |
"Method of Reducing Hardware Overhead Upon Generation of Test Pattern in Built-in Self Test"
|
6 |
"Apparatus For Implementation of Adaptive Routing In Packet Switched Networks"
|
5 |
"Apparatus For Generating Deterministic Test Pattern Using Phase Shifter"
|
[1][2][3][4] |