21

"THREE DIMENTIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILICON VIA BASED ON ROTATABLE CUBE"
Inventors : 강성호, 정민호
Application Number : 15/894,787, Filing Date : 2018.02.12
Country : 미국

20

"CIRCUIT FOR TESTING AND ANALYZING TSV AND METHOD OF TESTING THE SAME"
Inventors : 강성호, 이영우
Application Number : 15/460,488, Filing Date : 2017.03.16
Country : 미국

19

"THREE-DIMENSIONAL INTEGRATED CIRCUIT"
Inventors : 강성호, 강동호, 이인걸
Application Number : 15/422,578, Filing Date : 2017.02.02
Country : 미국

18

"TEST CIRCUIT FOR 3D SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THEREOF"
Inventors : 강성호, 이인걸
Application Number : 15/291172, Filing Date : 2016.10.12
Country : 미국

17

"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
Inventors : 강성호, 박재석
Application Number : 14/785,042, Filing Date : 2015.10.16
Country : 미국

16

"VOLTAGE ISLAND FORMATION FOR 3D MANY-CORE CHIP MULTIPROCESSOR"
Inventors : 강성호, 홍혜정
Application Number : 14/579023, Filing Date : 2014.12.22
Country : 미국

15

"METHOD AND DEVICE FOR REPAIRING MEMORY (메모리 수리 방법 및 메모리 수리 장치)"
Inventors : 강성호, 조기원
Application Number : 14/479657, Filing Date : 2014.09.08
Country : 미국

14

"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
Inventors : 강성호, 박재석
Application Number : PCT/KR2014/001507, Filing Date : 2014.02.05
Country :

13

"MULTI-CORE DEVICE, TEST DEVICE AND METHOD FOR DIAGNOSING FAILURE"
Inventors : 강성호, 한태우
Application Number : 14/158170, Filing Date : 2014.01.17
Country : 미국

12

"Matching method of diagnosing multiple stuck-at faults"
Inventors : 강성호
Application Number : PCT/KR2007/003127, Filing Date : 2007.06.27
Country : 미국