13

"MULTI-CORE DEVICE, TEST DEVICE AND METHOD FOR DIAGNOSING FAILURE"
Inventors : 강성호, 한태우
Application Number : 14/158170, Filing Date : 2014.01.17
Country : 미국

12

"Matching method of diagnosing multiple stuck-at faults"
Inventors : 강성호
Application Number : PCT/KR2007/003127, Filing Date : 2007.06.27
Country : 미국

11

"Method and apparatus for reducing transition number using transition monitoring window"
Inventors : 강성호, 김유빈, 양명훈, 이용
Application Number : 11/159025, Filing Date : 2007.06.18
Country : 미국

10

""Method for Diagnosing Troubles in Scan Chain via Symbolic Simulation"
Inventors : 강성호
Application Number : PCT/KR2007/000732(333), Filing Date : 2007.02.09
Country : 미국

9

"분할된 LFSR을 이용한 저전력 결정패턴 BIST 방법 및 장치"
Inventors : 강성호, 양명훈, 김유빈
Application Number : PCT/KR2006/004847, Filing Date : 2006.11.17
Country :

8

"Method and Apparatus for Reducing Number of Transitions Generated by Linear Feedback Shift Register"
Inventors : 강성호, 김유빈, 양명훈, 이용
Application Number : US11/159025, Filing Date : 2005.06.22
Country : 미국

7

"Method of Reducing Hardware Overhead Upon Generation of Test Pattern in Built-in Self Test"
Inventors : 강성호, 송동섭
Application Number : 11/022917, Filing Date : 2004.12.24
Country : 미국

6

"Apparatus For Implementation of Adaptive Routing In Packet Switched Networks"
Inventors : 강성호, 배성일
Application Number : 10/937369, Filing Date : 2004.09.10
Country : 미국

5

"Apparatus For Generating Deterministic Test Pattern Using Phase Shifter"
Inventors : 강성호, 송동섭
Application Number : 10/896197, Filing Date : 2004.07.20
Country : 미국

4

"Test Data Compression and Decompression Method Using Zero-Detected Run-length Code (ZDR) in System-on-Chip"
Inventors : 강성호, 이용
Application Number : 10/867588, Filing Date : 2004.06.15
Country : 미국


[1][2][3]