18

"TEST CIRCUIT FOR 3D SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THEREOF"
Inventors : 강성호, 이인걸
Application Number : 15/291172, Filing Date : 2016.10.12
Country : 미국

17

"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
Inventors : 강성호, 박재석
Application Number : 14/785,042, Filing Date : 2015.10.16
Country : 미국

16

"VOLTAGE ISLAND FORMATION FOR 3D MANY-CORE CHIP MULTIPROCESSOR"
Inventors : 강성호, 홍혜정
Application Number : 14/579023, Filing Date : 2014.12.22
Country : 미국

15

"METHOD AND DEVICE FOR REPAIRING MEMORY (메모리 수리 방법 및 메모리 수리 장치)"
Inventors : 강성호, 조기원
Application Number : 14/479657, Filing Date : 2014.09.08
Country : 미국

14

"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
Inventors : 강성호, 박재석
Application Number : PCT/KR2014/001507, Filing Date : 2014.02.05
Country :

13

"MULTI-CORE DEVICE, TEST DEVICE AND METHOD FOR DIAGNOSING FAILURE"
Inventors : 강성호, 한태우
Application Number : 14/158170, Filing Date : 2014.01.17
Country : 미국

12

"Matching method of diagnosing multiple stuck-at faults"
Inventors : 강성호
Application Number : PCT/KR2007/003127, Filing Date : 2007.06.27
Country : 미국

11

"Method and apparatus for reducing transition number using transition monitoring window"
Inventors : 강성호, 김유빈, 양명훈, 이용
Application Number : 11/159025, Filing Date : 2007.06.18
Country : 미국

10

""Method for Diagnosing Troubles in Scan Chain via Symbolic Simulation"
Inventors : 강성호
Application Number : PCT/KR2007/000732(333), Filing Date : 2007.02.09
Country : 미국

9

"분할된 LFSR을 이용한 저전력 결정패턴 BIST 방법 및 장치"
Inventors : 강성호, 양명훈, 김유빈
Application Number : PCT/KR2006/004847, Filing Date : 2006.11.17
Country :