34

"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
Inventors : 강성호, 이하영
Application Number : 18/490,671, Filing Date : 2023.10.19
Country : 미국

33

"SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS"
Inventors : 강성호, 이상준
Application Number : 17/994,866, Filing Date : 2022.11.28
Country : 미국

32

"SCAN CORRELATION‐AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS FOR LOW‐POWER TESTING"
Inventors : 강성호, 이상준
Application Number : 17/931,044, Filing Date : 2022.09.09
Country : 미국

31

"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
Inventors : 강성호, 이영광
Application Number : 202211063563.6, Filing Date : 2022.09.01
Country : 중국

30

"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
Inventors : 강성호, 이영광
Application Number : 17/875,889, Filing Date : 2022.07.28
Country : 미국

29

"METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE AND SEMICONDUCTOR DEVICE"
Inventors : 강성호, 이영광
Application Number : 202210792232.X, Filing Date : 2022.07.11
Country : 중국

28

" METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING THE SAME AND SEMICONDUCTOR DEVICE INCLUDING THE SAME"
Inventors : 강성호, 이영광
Application Number : 17/660,920, Filing Date : 2022.04.07
Country : 미국

27

"SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD"
Inventors : 강성호, 장석준
Application Number : 17/673.075, Filing Date : 2022.02.16
Country : 미국

26

"REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS"
Inventors : 강성호, 김태현
Application Number : 17/508910, Filing Date : 2021.10.22
Country : 미국

25

"ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVASIVE ATTACKS"
Inventors : 강성호, 이영우
Application Number : 16/877100, Filing Date : 2020.05.18
Country : 미국