34 |
"SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF"
|
33 |
"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
|
32 |
"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
|
31 |
"SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS"
|
30 |
"SCAN CORRELATION‐AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS FOR LOW‐POWER TESTING"
|
29 |
"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
|
28 |
"METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE AND SEMICONDUCTOR DEVICE"
|
27 |
"SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD"
|
26 |
"REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS"
|
25 |
"ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVASIVE ATTACKS"
|
[1][2][3][4] |