40

"SEMICONDUCTOR INTEGRATED CIRCUIT FOR PERFORMING REPAIR OPERATION ON THROUGH SILICON VIA (TSV)"
Inventors : 강성호, 장석준, 한동현
Application Number : 19/020,197, Filing Date : 2025.01.14
Country : 미국

39

"CIRCUIT SELF TEST APPARATUS AND OPERATING METHOD THEREOF"
Inventors : 강성호, 박종호
Application Number : 18/975,781, Filing Date : 2024.12.10
Country : 미국

38

"APPARATUS AND METHOD FOR PRE-ANALYZING MEMORY FAULT INFORMATION"
Inventors : 강성호, 이하영
Application Number : 18/795,537, Filing Date : 2024.08.06
Country : 미국

37

"NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS"
Inventors : 강성호, 이하영
Application Number : 18/757,178, Filing Date : 2024.06.27
Country : 미국

36

"SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF"
Inventors : 강성호, 장석준
Application Number : 18/395,745, Filing Date : 2023.12.26
Country : 미국

35

"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
Inventors : 강성호, 이하영
Application Number : 2023-180907, Filing Date : 2023.10.20
Country : 일본

34

"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
Inventors : 강성호, 이하영
Application Number : 18/490,671, Filing Date : 2023.10.19
Country : 미국

33

"SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS"
Inventors : 강성호, 이상준
Application Number : 17/994,866, Filing Date : 2022.11.28
Country : 미국

32

"SCAN CORRELATION‐AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS FOR LOW‐POWER TESTING"
Inventors : 강성호, 이상준
Application Number : 17/931,044, Filing Date : 2022.09.09
Country : 미국

31

"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
Inventors : 강성호, 이영광
Application Number : 202211063563.6, Filing Date : 2022.09.01
Country : 중국