44

"PROCESSOR INCLUDING BUILT-IN SELF-TEST CIRCUIT, METHOD OF OPERATING THE PROCESSOR, AND METHOD OF MANUFACTURING THE SAME"
Inventors : 강성호, 박종호
Application Number : 19/647,095, Filing Date : 2026.04.14
Country : 미국

43

"PROCESSOR INCLUDING BUILT-IN SELF-TEST CIRCUIT, METHOD OF OPERATING THE PROCESSOR, AND METHOD OF MANUFACTURING THE SAME"
Inventors : 강성호, 김혜민
Application Number : 19/644,433, Filing Date : 2026.04.10
Country : 미국

42

"DIE, DEVICE AND METHOD FOR TESTING THROUGH SILICON VIA"
Inventors : 강성호, 김성훈
Application Number : 19/535,396, Filing Date : 2026.02.10
Country : 미국

41

"SYSTEM AND METHOD FOR CORRECTING ERROR OF HIGH BANDWIDTH MEMORY"
Inventors : 강성호, 신승호
Application Number : 19/408,931, Filing Date : 2025.12.04
Country : 미국

40

"SEMICONDUCTOR INTEGRATED CIRCUIT FOR PERFORMING REPAIR OPERATION ON THROUGH SILICON VIA (TSV)"
Inventors : 강성호, 장석준, 한동현
Application Number : 19/020,197, Filing Date : 2025.01.14
Country : 미국

39

"CIRCUIT SELF TEST APPARATUS AND OPERATING METHOD THEREOF"
Inventors : 강성호, 박종호
Application Number : 18/975,781, Filing Date : 2024.12.10
Country : 미국

38

"APPARATUS AND METHOD FOR PRE-ANALYZING MEMORY FAULT INFORMATION"
Inventors : 강성호, 이하영
Application Number : 18/795,537, Filing Date : 2024.08.06
Country : 미국

37

"NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS"
Inventors : 강성호, 이하영
Application Number : 18/757,178, Filing Date : 2024.06.27
Country : 미국

36

"SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF"
Inventors : 강성호, 장석준
Application Number : 18/395,745, Filing Date : 2023.12.26
Country : 미국

35

"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
Inventors : 강성호, 이하영
Application Number : 2023-180907, Filing Date : 2023.10.20
Country : 일본