36

"APPARATUS AND METHOD FOR PRE-ANALYZING MEMORY FAULT INFORMATION"
Inventors : 강성호, 이하영
Application Number : 18/795,537, Filing Date : 2024.08.06
Country : 미국

35

"NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS"
Inventors : 강성호, 이하영
Application Number : 18/757,178, Filing Date : 2024.06.27
Country : 미국

34

"SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF"
Inventors : 강성호, 장석준
Application Number : 18/395,745, Filing Date : 2023.12.26
Country : 미국

33

"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
Inventors : 강성호, 이하영
Application Number : 2023-180907, Filing Date : 2023.10.20
Country : 일본

32

"METHOD FOR STORING MEMORY FAULT DATA, APPARATUS AND COMPUTER PROGRAM FOR PERFORMING THE METHOD"
Inventors : 강성호, 이하영
Application Number : 18/490,671, Filing Date : 2023.10.19
Country : 미국

31

"SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS"
Inventors : 강성호, 이상준
Application Number : 17/994,866, Filing Date : 2022.11.28
Country : 미국

30

"SCAN CORRELATION‐AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS FOR LOW‐POWER TESTING"
Inventors : 강성호, 이상준
Application Number : 17/931,044, Filing Date : 2022.09.09
Country : 미국

29

"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
Inventors : 강성호, 이영광
Application Number : 17/875,889, Filing Date : 2022.07.28
Country : 미국

28

"METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE AND SEMICONDUCTOR DEVICE"
Inventors : 강성호, 이영광
Application Number : 202210792232.X, Filing Date : 2022.07.11
Country : 중국

27

"SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD"
Inventors : 강성호, 장석준
Application Number : 17/673.075, Filing Date : 2022.02.16
Country : 미국