30 |
"SCAN CORRELATION‐AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS FOR LOW‐POWER TESTING"
|
29 |
"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
|
28 |
"METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE AND SEMICONDUCTOR DEVICE"
|
27 |
"SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD"
|
26 |
"REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS"
|
25 |
"ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVASIVE ATTACKS"
|
24 |
"METHOD AND APPARATUS FOR BUILT IN REDUNDANCY ANALYSIS WITH DYNAMIC FAULT RECONFIGURATION"
|
23 |
"STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIR METHOD THEREOF"
|
22 |
"STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAIRING THE SAME"
|
21 |
"THREE DIMENTIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILICON VIA BASED ON ROTATABLE CUBE"
|
[1][2][3] |