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"Test Data Compression and Decompression Method Using Zero-Detected Run-length Code(ZDR) in System-on-Chip"
Inventors : 강성호, 이용
Patent Number : 7299236, Issue Date : 2007.11.20

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"Method and data processing system for verifying circuit test vectors"
Inventors : Sungho Kang, Underwood, Law, H. Konuk
Patent Number : 5600787, Issue Date : 1997.02.04

2

"Method and data processing system for determining electrical circuit path delays"
Inventors : Sungho Kang, Underwood, Law, H. Konuk
Patent Number : 5583787, Issue Date : 1996.12.10

1

"Method and data processing system for testing circuits using boolean differences"
Inventors : Sungho Kang, Underwood, Law, H. Konuk
Patent Number : 5517506, Issue Date : 1996.05.14


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