11

"TEST CIRCUIT FOR 3D SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THEREOF"
Inventors : 강성호, 이인걸
Patent Number : 10/095591, Issue Date : 2018.10.9

10

"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
Inventors : 강성호, 박재석
Patent Number : 10/001525, Issue Date : 2018.06.19

9

"Multi-core device, test device, and method of diagnosing failure"
Inventors : 강성호, 한태우
Patent Number : 9672128, Issue Date : 2017.06.06

8

"Method and device for repairing memory"
Inventors : 강성호, 조기원
Patent Number : 9666309, Issue Date : 2017.05.30

7

"Method of Generating Voltage Island for 3D Many-core Chip Multiprocessor"
Inventors : 강성호, 홍혜정
Patent Number : 9230051, Issue Date : 2016.01.05

6

"Apparatus for Implementation of Adaptive Routing in Packet Switching Networks"
Inventors : 안진호, 배성일, 김영용, 강성호
Patent Number : 7327685, Issue Date : 2008.02.05

5

"Method and Apparatus for Reducing Number of Transitions Generated by Linear Feedback Shift Register"
Inventors : 강성호, 김유빈, 양명훈, 이용
Patent Number : 7428681, Issue Date : 2008.09.23

4

"Test Data Compression and Decompression Method Using Zero-Detected Run-length Code(ZDR) in System-on-Chip"
Inventors : 강성호, 이용
Patent Number : 7299236, Issue Date : 2007.11.20

3

"Method and data processing system for verifying circuit test vectors"
Inventors : Sungho Kang, Underwood, Law, H. Konuk
Patent Number : 5600787, Issue Date : 1997.02.04

2

"Method and data processing system for determining electrical circuit path delays"
Inventors : Sungho Kang, Underwood, Law, H. Konuk
Patent Number : 5583787, Issue Date : 1996.12.10