27

"NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS"
Inventors : 강성호, 이하영
Patent Number : 12670965, Issue Date : 2026.06.30

26

"SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVICE AND OPERATING METHOD THEREOF"
Inventors : 강성호, 이영광
Patent Number : 12622321, Issue Date : 2026.05.05

25

"SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS"
Inventors : 강성호, 이상준
Patent Number : 12607979, Issue Date : 2026.04.21

24

"SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF"
Inventors : 강성호, 장석준
Patent Number : 12405303, Issue Date : 2025.09.02

23

"METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING THE SAME AND SEMICONDUCTOR DEVICE INCLUDING THE SAME"
Inventors : 강성호, 이영광
Patent Number : 12283529, Issue Date : 2025.04.22

22

"메모리 고장 데이터 저장 방법, 이를 수행하는 장치 및 컴퓨터 프로그램 (メモリ故障データの保存方法、これを行う装置、およびコンピュータプログラム)"
Inventors : 강성호, 이하영
Patent Number : 7608560, Issue Date : 2024.12.10

21

"SCAN CORRELATION-AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS FOR LOW-POWER TESTING"
Inventors : 강성호, 이상준
Patent Number : 12000891, Issue Date : 2024.06.04

20

"REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS"
Inventors : 강성호, 김태현
Patent Number : 11631474, Issue Date : 2023.04.18

19

"SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD"
Inventors : 강성호, 장석준
Patent Number : 11567132, Issue Date : 2023.01.31

18

"ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVASIVE ATTACKS"
Inventors : 강성호, 이영우
Patent Number : 11387196, Issue Date : 2022.07.12