20

"REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS"
Inventors : 강성호, 김태현
Patent Number : 11631474, Issue Date : 2023.04.18

19

"SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD"
Inventors : 강성호, 장석준
Patent Number : 11567132, Issue Date : 2023.01.31

18

"ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVASIVE ATTACKS"
Inventors : 강성호, 이영우
Patent Number : 11387196, Issue Date : 2022.07.12

17

"METHOD AND APPARATUS FOR BUILT IN REDUNDANCY ANALYSIS WITH DYNAMIC FAULT RECONFIGURATION"
Inventors : 강성호, 이하영
Patent Number : 11386973, Issue Date : 2022.07.12

16

"STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIR METHOD THEREOF"
Inventors : 강성호, 한동현, 이하영
Patent Number : 11315657, Issue Date : 2022.04.26

15

"CIRCUIT FOR TESTING AND ANALYZING TSV AND METHOD OF TESTING THE SAME"
Inventors : 강성호, 이영우
Patent Number : 10401422, Issue Date : 2019.09.03

14

"THREE DIMENTIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILICON VIA BASED ON ROTATABLE CUBE"
Inventors : 강성호, 정민호
Patent Number : 15/894787, Issue Date : 2019.09.03

13

"STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAIRING THE SAME"
Inventors : 강성호, 한동현
Patent Number : 15/988970, Issue Date : 2019.08.27

12

"THREE-DIMENSIONAL INTEGRATED CIRCUIT"
Inventors : 강성호, 강동호, 이인걸
Patent Number : 10170398, Issue Date : 2019.01.01

11

"TEST CIRCUIT FOR 3D SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THEREOF"
Inventors : 강성호, 이인걸
Patent Number : 10/095591, Issue Date : 2018.10.9