15

"CIRCUIT FOR TESTING AND ANALYZING TSV AND METHOD OF TESTING THE SAME"
Inventors : 강성호, 이영우
Patent Number : 10401422, Issue Date : 2019.09.03

14

"THREE DIMENTIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILICON VIA BASED ON ROTATABLE CUBE"
Inventors : 강성호, 정민호
Patent Number : 15/894,787, Issue Date : 2019.09.03

13

"STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAIRING THE SAME"
Inventors : 강성호, 한동현
Patent Number : 15/988,970, Issue Date : 2019.08.27

12

"THREE-DIMENSIONAL INTEGRATED CIRCUIT"
Inventors : 강성호, 강동호, 이인걸
Patent Number : 10170398, Issue Date : 2019.01.01

11

"TEST CIRCUIT FOR 3D SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THEREOF"
Inventors : 강성호, 이인걸
Patent Number : 10/095591, Issue Date : 2018.10.9

10

"SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME"
Inventors : 강성호, 박재석
Patent Number : 10/001525, Issue Date : 2018.06.19

9

"Multi-core device, test device, and method of diagnosing failure"
Inventors : 강성호, 한태우
Patent Number : 9672128, Issue Date : 2017.06.06

8

"Method and device for repairing memory"
Inventors : 강성호, 조기원
Patent Number : 9666309, Issue Date : 2017.05.30

7

"Method of Generating Voltage Island for 3D Many-core Chip Multiprocessor"
Inventors : 강성호, 홍혜정
Patent Number : 9230051, Issue Date : 2016.01.05

6

"Apparatus for Implementation of Adaptive Routing in Packet Switching Networks"
Inventors : 안진호, 배성일, 김영용, 강성호
Patent Number : 7327685, Issue Date : 2008.02.05


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