138

"Test Scheduling Using Ant Colony Optimization for 3D Integrated Circuits"
Inhyuk Choi, Taewoo Han, and Sungho Kang
ISOCC 2013
pp.15-16, Nov 2013

137

"Efficient TSV repair method for 3D memories"
Ilwoong Kim, Keewon Cho, and Sungho Kang
ISOCC 2013
pp.17-18, Nov 2013

136

"Scan chain swapping using TSVs for test power reduction in 3D-IC"
Ingeol Lee, Jaeseok Park, Sungho Kang
ISOCC 2013
pp.170-171, Nov 2013

135

"An Efficient RPCT based on Test Data Compression using Burst Clock Controller in 3D-IC"
Yong Lee, SungYoul Seo, Sungho Kang
ISOCC 2013
pp.176-179, Nov 2013

134

"Bit Transmission Error Correction Scheme for FlexRay Based Automotive Communication Systems"
Inhyuk Choi, Taewoo Han, and Sungho Kang
IEEE GCCE 2013
pp. 448-490, Oct 2013

133

"A New TSV Set Architecture for High Reliability"
Jaeseok Park and Sungho Kang
The 5th Asia Symposium on Quality Electronic Design (ASQED)
pp.123-126, 2013

132

"NBTI Aware Voltage Scaling Using Linear Transient Weighted Factors"
Jaeil Lim, Hyejeong Hong and Sungho Kang
Proceeding of ITC-CSCC 2013
pp.300-302, Jul 2013

131

"A Reliable Massively Parallel Testing Method for Wafer Testing"
Haksong Kim, Yong Lee, Sungyoul Seo and Sungho Kang
Proceeding of ITC-CSCC 2013
pp.377-379, Jul 2013

130

"Process Variation-Aware Floorplanning for 3D Many-Core Processors"
Hyejeong Hong, Jaeil Lim and Sungho Kang
2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)
pp.196-199, Dec 2012

129

"Integration of Dual Channel Timing Formatter System for High Speed Memory Test Equipment"
Jaeseok Park, Ingeol Lee, Young-Seok Park, Sung-Geun Kim, Kyung Ho Ryu, Dong-Hoon Jung, Kangwook Jo, Choong Keun Lee, Hongil Yoon, Seong-Ook Jung, Woo-Young Choi and Sungho Kang
Proceedings of International SOC Design Conference (ISOCC 2012)
pp.185-187, Nov 2012