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148 |
"KRAFT_K-associative Ralative Addressing Flash Transition Layer"
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147 |
"Low Power Scan Bypass Technique with Test Data Reduction"
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146 |
"Near Optimal Repair Rate Built-in Redundancy Analysis with Very Small Hardware Overhead"
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145 |
"A Scan Shifting Method based on Clock Gating of Multiple Groups for Low Power Scan Testing"
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144 |
"A New Redundancy Analysis Algorithm Using One Side Pivot "
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143 |
"Reducing the Failure Bitmap Size with a Partial Solution Search Tree for the Low Cost Automatic Test Equipment (ATE)."
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142 |
"Scan Cell Reordering Algorithm for Low Power Consumption during Scan-Based Testing"
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141 |
"An Online Test and Debug Methodology for Automotive Image Processing System"
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140 |
"A Scalable and Parallel Test Access Strategy for NoC-based Multicore System"
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139 |
"A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories "
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