"A Scan Shifting Method based on Clock Gating of Multiple Groups for Low Power Scan Testing"
Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
ISQED 2015
pp.162-166, Mar 2015


"A New Redundancy Analysis Algorithm Using One Side Pivot "
Jooyoung Kim, Keewon Cho, Woosung Lee, Sungho Kang
ISOCC 2014
pp.134-135, Nov 2014


"Reducing the Failure Bitmap Size with a Partial Solution Search Tree for the Low Cost Automatic Test Equipment (ATE)."
Keewon Cho, Woosung Lee, Jooyoung Kim, Sungho Kang
ISOCC 2014
pp.128-129, Nov 2014


"Scan Cell Reordering Algorithm for Low Power Consumption during Scan-Based Testing"
Wooheon Kang, Hyunyul Lim, Sungho Kang
ISOCC 2014
pp.300-301, Nov 2014


"An Online Test and Debug Methodology for Automotive Image Processing System"
Hyunggoy Oh, Inhyuk Choi, Taewoo Han, Won Jung, Byungin Moon, Sungho Kang
ISOCC 2014
pp.226-227, Nov 2014


"A Scalable and Parallel Test Access Strategy for NoC-based Multicore System"
Taewoo Han, Inhyuk Choi, Hyunggyo Oh, Sungho Kang
The Asian Test Symposium
pp.81-86, Sep 2014


"A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories "
Wooheon Kang, Changwook Lee, Keewon Cho, and Sungho Kang
The Asian Test Symposium 2013
pp.301-306, Nov 2013


"Test Scheduling Using Ant Colony Optimization for 3D Integrated Circuits"
Inhyuk Choi, Taewoo Han, and Sungho Kang
ISOCC 2013
pp.15-16, Nov 2013


"Efficient TSV repair method for 3D memories"
Ilwoong Kim, Keewon Cho, and Sungho Kang
ISOCC 2013
pp.17-18, Nov 2013


"Scan chain swapping using TSVs for test power reduction in 3D-IC"
Ingeol Lee, Jaeseok Park, Sungho Kang
ISOCC 2013
pp.170-171, Nov 2013

[1][2][3][4][5][6][7][8][9][10] Next Page>>