143

"Reducing the Failure Bitmap Size with a Partial Solution Search Tree for the Low Cost Automatic Test Equipment (ATE)."
Keewon Cho, Woosung Lee, Jooyoung Kim, Sungho Kang
ISOCC 2014
pp.128-129, Nov 2014

142

"Scan Cell Reordering Algorithm for Low Power Consumption during Scan-Based Testing"
Wooheon Kang, Hyunyul Lim, Sungho Kang
ISOCC 2014
pp.300-301, Nov 2014

141

"An Online Test and Debug Methodology for Automotive Image Processing System"
Hyunggoy Oh, Inhyuk Choi, Taewoo Han, Won Jung, Byungin Moon, Sungho Kang
ISOCC 2014
pp.226-227, Nov 2014

140

"A Scalable and Parallel Test Access Strategy for NoC-based Multicore System"
Taewoo Han, Inhyuk Choi, Hyunggyo Oh, Sungho Kang
The Asian Test Symposium
pp.81-86, Sep 2014

139

"A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories "
Wooheon Kang, Changwook Lee, Keewon Cho, and Sungho Kang
The Asian Test Symposium 2013
pp.301-306, Nov 2013

138

"Test Scheduling Using Ant Colony Optimization for 3D Integrated Circuits"
Inhyuk Choi, Taewoo Han, and Sungho Kang
ISOCC 2013
pp.15-16, Nov 2013

137

"Efficient TSV repair method for 3D memories"
Ilwoong Kim, Keewon Cho, and Sungho Kang
ISOCC 2013
pp.17-18, Nov 2013

136

"Scan chain swapping using TSVs for test power reduction in 3D-IC"
Ingeol Lee, Jaeseok Park, Sungho Kang
ISOCC 2013
pp.170-171, Nov 2013

135

"An Efficient RPCT based on Test Data Compression using Burst Clock Controller in 3D-IC"
Yong Lee, SungYoul Seo, Sungho Kang
ISOCC 2013
pp.176-179, Nov 2013

134

"Bit Transmission Error Correction Scheme for FlexRay Based Automotive Communication Systems"
Inhyuk Choi, Taewoo Han, and Sungho Kang
IEEE GCCE 2013
pp. 448-490, Oct 2013


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