168

"A Selective Error Data Capture Method using On-Chip DRAM for Silicon Debug of Multi-core Design"
Hyunggoy Oh, Heetae Kim, Jaeil Lim, and Sungho Kang
International SOC Design Conference (ISOCC 2017)
September 2017

167

"Test Data Reduction Method Based on Berlekamp-Massey Algorithm"
HyeonChan Lim, Junghwan Kim, Soyeon Kang, and Sungho Kang
International SOC Design Conference (ISOCC 2017)
September 2017

166

"LARECD : Low Area overhead and Reliable Error Correction DMR architecture"
Hyunyul Lim, Taehyun Kim, Dongsu Lee, and Sungho Kang
International SOC Design Conference (ISOCC 2017)
September 2017

165

"Test Item Priority Estimation for High Parallel Test Efficiency under ATE Debug Time Constraints"
Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, and Sungho Kang
The 1st IEEE International Test Conference in Asia (ITC-Asia)
September 2017

164

"Broadcast Scan Compression Based on Deterministic Pattern Generation Algorithm"
Hyeonchan Lim, Sungyoul Seo, Soyeon Kang and Sungho Kang
ISQED 2017
March 2017

163

"Off-Chip Test Architecture for Improving Multi-Site Testing Efficiency using Tri-State Decoder and 3V-Level Encoder"
Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, and Sungho Kang
ISQED 2017
March 2017

162

"Test Access Mechanism for Stack Test Time Reduction of 3-Dimensional Integrated Circuit"
Inhyuk Choi, Hyunggoy Oh, and Sungho Kang
APCCAS 2016
Oct 2016

161

"A New Online Test and Debug Methodology for Automotive Camera Image Processing System"
Hyunggoy Oh, Inhyuk Choi, and Sungho Kang
APCCAS 2016
Oct 2016

160

"A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs"
Young-woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang
ISOCC 2016
Oct 2016

159

"P-Backtrace A New Scan Chain Diagnosis Method with Probability"
Tae Hyun Kim, Hyun Yul Lim, Sungho Kang
ISOCC 2016
Oct 2016