153

"A New In-field Bad Block Detection Scheme for NAND flash Chips "
Dongho Kang, Keewon Cho, Sungho Kang
ISOCC 2015
Nov 2015

152

"A 2-D compaction Method using Macro block for Post-Silicon Validation "
Won Jung, Hyunggoy Oh, Dongho Kang, Sungho Kang
ISOCC 2015
Nov 2015

151

"A Scan Segment Skip Technique for Low Power Test "
Hayoung Lee, Junkyu Lee, Hyunyul Lim, Sungho Kang
ISOCC 2015
Nov 2015

150

"A New Built-in Redundancy Analysis Algorithm Based On Multiple Memory Blocks"
Jooyoung Kim, Keewon Cho, Woosung Lee, Sungho Kang
ISOCC 2015
Nov 2015

149

"Failure Bitmap Compression Method for 3D-IC Redundancy Analysis"
Keewon Cho, Woosung Lee, Jooyoung Kim, Sungho Kang
ISOCC 2015
Nov 2015

148

"KRAFT_K-associative Ralative Addressing Flash Transition Layer"
Dongho Kang, Jaeseok Park, Ilwoong Kim, Ingeol Lee, and Sungho Kang
Proceedings of ITC-CSCC 2015
June 2015

147

"Low Power Scan Bypass Technique with Test Data Reduction"
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
ISQED 2015
pp.173-176, Mar 2015

146

"Near Optimal Repair Rate Built-in Redundancy Analysis with Very Small Hardware Overhead"
Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang
ISQED 2015
pp.435-439, Mar 2015

145

"A Scan Shifting Method based on Clock Gating of Multiple Groups for Low Power Scan Testing"
Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
ISQED 2015
pp.162-166, Mar 2015

144

"A New Redundancy Analysis Algorithm Using One Side Pivot "
Jooyoung Kim, Keewon Cho, Woosung Lee, Sungho Kang
ISOCC 2014
pp.134-135, Nov 2014


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