188

"Fail Memory Configuration Set for RA Estimation"
Hayoung Lee, Keewon Cho, and Sungho Kang, Wooheon Kang, Seungtaek Lee, and Woosik Jeong
IEEE International Test Conference(ITC)
NOV 2020

187

"Diagnosis of Scan Chain Faults Based-on Machine-Learning"
Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim and Sungho Kang
International SOC Design Conference (ISOCC 2020)
OCT 2020

186

"Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair "
Hayoung Lee, Donghyun Han, Hogyeong Kim, and Sungho Kang
International SOC Design Conference (ISOCC 2020)
OCT 2020

185

"Memory-like Defect Diagnosis for CMOL FPGAs"
Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, and Sungho Kang
International SOC Design Conference (ISOCC 2020)
OCT 2020

184

"W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction"
Hayoung Lee, Donghyun Han, Hogyeong Kim and Sungho Kang
IEEE International Test Conference in Asia (ITC-Asia)
SEP 2020

183

"An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults"
Hyeonchan Lim, Seokjun Jang, Seunghwan Kim and Sungho Kang
International SOC Design Conference (ISOCC 2019)
OCT 2019

182

"A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density"
Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, and Sungho Kang
International SOC Design Conference (ISOCC 2019)
OCT 2019

181

"Redundancy Analysis based on Fault Distribution for memory with complex spares"
Hayoung Lee, Donghyun Han, Seungtaek Lee, and Sungho Kang
International SOC Design Conference (ISOCC 2019)
OCT 2019

180

"Tunable Compact Probing Detector with Fast Analysis Time Against Invasive Attacks"
Young-woo Lee, Youngkwang Lee, Minho Moon and Sungho Kang
International SOC Design Conference (ISOCC 2019)
OCT 2019

179

"Transition-delay Test Methodology for Designs with Self-gating"
Jihye Kim, Sangjun Lee, Minho Moon and Sungho Kang
International SOC Design Conference (ISOCC 2019)
OCT 2019