163

"Off-Chip Test Architecture for Improving Multi-Site Testing Efficiency using Tri-State Decoder and 3V-Level Encoder"
Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, and Sungho Kang
ISQED 2017
March 2017

162

"Test Access Mechanism for Stack Test Time Reduction of 3-Dimensional Integrated Circuit"
Inhyuk Choi, Hyunggoy Oh, and Sungho Kang
APCCAS 2016
Oct 2016

161

"A New Online Test and Debug Methodology for Automotive Camera Image Processing System"
Hyunggoy Oh, Inhyuk Choi, and Sungho Kang
APCCAS 2016
Oct 2016

160

"A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs"
Young-woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang
ISOCC 2016
Oct 2016

159

"P-Backtrace A New Scan Chain Diagnosis Method with Probability"
Tae Hyun Kim, Hyun Yul Lim, Sungho Kang
ISOCC 2016
Oct 2016

158

"A Test Methodology to Screen Scan-Path Failures"
Junghwan Kim, Young-woo Lee, Minho Cheong, Sungyoul Seo and Sungho Kang
ISOCC 2016
Oct 2016

157

"Process Variation-aware Bridge Fault Analysis"
Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang
ISOCC 2016
Oct 2016

156

"Discussion of Cost-effective Redundancy Architectures"
Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang
ISOCC 2016
Oct 2016

155

"Software-Based Embedded Core Test Using Multi-Polynomial for Test Data Reduction"
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
ISOCC 2016
Oct 2016,

154

"Scan Chain Reordering-aware X-Filling and Stitching for Scan Shift Power Reduction"
Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang
The Asian Test Symposium 2015
Nov 2015


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