38

"A 0.35um CMOS low noise VGA"
Kyuyoung Chung, Gunhee Han, Sungho Kang
Proceedings of AP-ASIC
pp.5-8, August 2000

37

"Test Methodology for Low Power SRAMs"
Hong-Sik Kim, Ilseok Suh, Sungho Kang, Gunhee Han
Proceedings of AP-ASIC
pp 277-280, August 2000

36

"Testability Strategy and DFT Methodology of CalmRISC32"
Hong-sik Kim, Ilseok Suh, Sungho Kang, Gunhee Han
Proceedings of AP-ASIC
pp.295-298, August 2000

35

"Delay Test for System on Chip"
Sungho Kang
Proceeding of Semicon Korea 2000
pp 399-402 , February 2000

34

"Dynamic Power Supply Current Test for CMOS SRAMs"
Do Hyun Yoon, Hongsik Kim, Sungho Kang
Proceedings of International Conference on VLSI and CAD
pp.399-402, October 1999

33

"An Efficient Interconnect Test Using BIST Module in a Boundary Scan Environment"
Hyun-Jin Kim, Jongcheol Shin, Sungho Kang
Proceeding of International Conference on VLSI and CAD
pp.328-329, October 1999

32

"A New Weight Set Generation Algorithm for Weighted Random Pattern Generation"
Hangkyu Lee, Sungho Kang
Proceeding of International Conference on Computer Design
pp.160-165, October 1999

31

"New Scan Design of Asynchronous Sequential Circuits"
Yong Seok Kang, Kyung-Hoi Huh, Sungho Kang
Proceedings of International Conference on AP-ASIC
pp.355-358, August 1999

30

"At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks"
Jongcheol Shin, Hyun-Jin Kim, Sungho Kang
Proceedings of International Conference on Design Automation and Test
pp.473-477, March 1999

29

"Weight Set Optimization for Weighted Random Pattern Generation"
Hangkyu Lee, Sungho Kang
Proceedings of International Technical Conference on CSCC
pp.1401-1404, July 1998