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88 |
"A Multiple Fault Diagnosis Method Based on a Single Fault Simulation"
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87 |
"A Hybrid Binary Search Scheme for IP Address Lookup"
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86 |
"LFSR Reseeding Methodology for Low Power and Deterministic Pattern"
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85 |
"A Novel Symbolic Simulation for Scan Chain Diagnosis"
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84 |
"Built-in Self-test for A/D Converters in the Presence of Transient Zones"
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83 |
"High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects"
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82 |
"An Effective Test Pattern Generation for Signal Integrity"
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81 |
"TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure"
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80 |
"Regular Mapping Methodology on Network on Chip for Heterogeneous Tasking Environment"
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79 |
"DTMW: Duplicated Transition Monitoring Window for Low Power Test based on Pseudo-Random BIST"
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