208

"LOTS: Low Overhead TSV Repair Method Using IEEE-1838 Standard Architecture"
Sunghoon Kim, Donghyun Han, Seokjun Jang, Sungho Kang
International SOC Design Conference (ISOCC 2023)
OCT 2023

207

"GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair"
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang
International SOC Design Conference (ISOCC 2023)
OCT 2023

206

"Machine Learning based Scan Chain Diagnosis for Double Faults"
Hyojoon Yun, Taehyun Kim, and Sungho Kang
International SOC Design Conference (ISOCC 2023)
OCT 2023

205

"A New Flip-flop Shared Architecture of Test Point Insertion for Scan Design"
Hyemin Kim, Sangjun Lee, Jongho Park, Sungwhan Park, Sungho Kang
International SOC Design Conference (ISOCC 2023)
OCT 2023

204

"Redundancy Analysis Simplification Scheme for High-Speed Memory Repair"
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
International SOC Design Conference (ISOCC 2023)
OCT 2023

203

"ZOS: Zero Overhead Scan for Systolic Array-based AI accelerator"
Jihye Kim, Hayoung Lee, Jongho Park, Sunho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

202

"Logic Diagnosis Based on Deep Learning for Multiple Faults"
Tae Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, and Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

201

"Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset"
Hyeonchan Lim, Hyojoon Yun, Juyong Lee, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

200

"An Improved Early Termination Methodology Using Convolutional Neural Network"
Seung Ho Shin , Hayoung Lee, Sooryeong Lee, Younwoo Yoo, and Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

199

"PROG: Per-Row Output Generator for BOST"
Sooryeong Lee, Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022