102 |
"XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults"
|
101 |
"A new wafer level latent defect screening methodology for highly reliable dram using a response surface method"
|
100 |
"An Efficient BIST Architecture for Embedded RAMs"
|
99 |
"An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation"
|
98 |
"A Prevenient Voltage Stress Test Method for High Density Memory"
|
97 |
"A New Low Energy BIST Using A Statistical Code"
|
96 |
"SA-Based Test Time Optimization for SoCs Using Networks-on-Chip"
|
95 |
"A New LFSR Reseeding based Test Compression Scheme by Virtual Reduction of Smax"
|
94 |
"Power-Aware Task Scheduling for Dynamic Voltage Selection and Power Management for Multiprocessors"
|
93 |
"An Efficient BIST Architecture for Embedded Dual-Port Memories"
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