162 |
"Test Access Mechanism for Stack Test Time Reduction of 3-Dimensional Integrated Circuit"
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161 |
"A New Online Test and Debug Methodology for Automotive Camera Image Processing System"
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160 |
"A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs"
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159 |
"P-Backtrace A New Scan Chain Diagnosis Method with Probability"
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158 |
"A Test Methodology to Screen Scan-Path Failures"
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157 |
"Process Variation-aware Bridge Fault Analysis"
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156 |
"Discussion of Cost-effective Redundancy Architectures"
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155 |
"Software-Based Embedded Core Test Using Multi-Polynomial for Test Data Reduction"
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154 |
"Scan Chain Reordering-aware X-Filling and Stitching for Scan Shift Power Reduction"
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153 |
"A New In-field Bad Block Detection Scheme for NAND flash Chips "
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