202

"Logic Diagnosis Based on Deep Learning for Multiple Faults"
Tae Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, and Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

201

"Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset"
Hyeonchan Lim, Hyojoon Yun, Juyong Lee, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

200

"An Improved Early Termination Methodology Using Convolutional Neural Network"
Seung Ho Shin , Hayoung Lee, Sooryeong Lee, Younwoo Yoo, and Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

199

"PROG: Per-Row Output Generator for BOST"
Sooryeong Lee, Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

198

"Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis"
Sunghoon Kim, Seokjun Jang, Youngki Moon, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

197

"Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST"
Jongho Park, Sangjun Lee, Inhwan Lee, Sungwhan Park, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

196

"FAME: Fault Address Memory Structure for Repair Time Reduction"
Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
International SOC Design Conference (ISOCC 2022)
OCT 2022

195

"A Circular-based TSV Repair Architecture"
Youngkwang Lee, Donghyun Han, Sooryeong Lee, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
OCT 2021

194

"Hardware Efficient Built-in Self-test Architecture for Power and Ground TSVs in 3D IC"
Donghyun Han, Youngkwang Lee, Sooryeong Lee, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
OCT 2021

193

"Hybrid Test Access Mechanism for Multiple Identical Cores"
Sangjun Lee, Jongho Park, Inhwan Lee, Kwonhyoung Lee, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
OCT 2021