162

"Test Access Mechanism for Stack Test Time Reduction of 3-Dimensional Integrated Circuit"
Inhyuk Choi, Hyunggoy Oh, and Sungho Kang
APCCAS 2016
, Oct 2016

161

"A New Online Test and Debug Methodology for Automotive Camera Image Processing System"
Hyunggoy Oh, Inhyuk Choi, and Sungho Kang
APCCAS 2016
, Oct 2016

160

"A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs"
Young-woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang
ISOCC 2016
, Oct 2016

159

"P-Backtrace A New Scan Chain Diagnosis Method with Probability"
Tae Hyun Kim, Hyun Yul Lim, Sungho Kang
ISOCC 2016
, Oct 2016

158

"A Test Methodology to Screen Scan-Path Failures"
Junghwan Kim, Young-woo Lee, Minho Cheong, Sungyoul Seo and Sungho Kang
ISOCC 2016
, Oct 2016

157

"Process Variation-aware Bridge Fault Analysis"
Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang
ISOCC 2016
, Oct 2016

156

"Discussion of Cost-effective Redundancy Architectures"
Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang
ISOCC 2016
, Oct 2016

155

"Software-Based Embedded Core Test Using Multi-Polynomial for Test Data Reduction"
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
ISOCC 2016
Oct 2016,

154

"Scan Chain Reordering-aware X-Filling and Stitching for Scan Shift Power Reduction"
Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang
The Asian Test Symposium 2015
, Nov 2015