|
164 |
"Broadcast Scan Compression Based on Deterministic Pattern Generation Algorithm"
|
|
163 |
"Off-Chip Test Architecture for Improving Multi-Site Testing Efficiency using Tri-State Decoder and 3V-Level Encoder"
|
|
162 |
"Test Access Mechanism for Stack Test Time Reduction of 3-Dimensional Integrated Circuit"
|
|
161 |
"A New Online Test and Debug Methodology for Automotive Camera Image Processing System"
|
|
160 |
"A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs"
|
|
159 |
"P-Backtrace A New Scan Chain Diagnosis Method with Probability"
|
|
158 |
"A Test Methodology to Screen Scan-Path Failures"
|
|
157 |
"Process Variation-aware Bridge Fault Analysis"
|
|
156 |
"Discussion of Cost-effective Redundancy Architectures"
|
| [1][2][3][4][5][6][7][8][9][10] 다음 페이지>> |