게시판

172	"3D Memory Formed of Unrepairable Memory Dice and Spare Layer" Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, and Sungho Kang TENCON 2018 , Oct 2018
171	"Neural Network Reliability Enhancement Approach using Dropout Underutilization in GPU" Dongsu Lee, Hyunyul Lim, Taehyun Kim, and Sungho Kang TENCON 2018 , Oct 2018
170	"A New Repair Scheme for TSV-based 3D Memory using Base Die Repair Cells" Donghyun Han, Hayoung Lee, Donghyun Kim, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
169	"An Efficient Built-in Self-Repair Scheme for Area Reduction" Keewon Cho, Young-woo Lee, Sungyoul Seo, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
168	"A Selective Error Data Capture Method using On-Chip DRAM for Silicon Debug of Multi-core Design" Hyunggoy Oh, Heetae Kim, Jaeil Lim, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
167	"Test Data Reduction Method Based on Berlekamp-Massey Algorithm" HyeonChan Lim, Junghwan Kim, Soyeon Kang, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
166	"LARECD : Low Area overhead and Reliable Error Correction DMR architecture" Hyunyul Lim, Taehyun Kim, Dongsu Lee, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
165	"Test Item Priority Estimation for High Parallel Test Efficiency under ATE Debug Time Constraints" Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, and Sungho Kang The 1st IEEE International Test Conference in Asia (ITC-Asia) , September 2017
164	"Broadcast Scan Compression Based on Deterministic Pattern Generation Algorithm" Hyeonchan Lim, Sungyoul Seo, Soyeon Kang and Sungho Kang ISQED 2017 , March 2017

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