게시판

174	"A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain" HyeonChan Lim, Seokjun Jang, and Sungho Kang International SOC Design Conference ( ISOCC 2018 ) , NOV 2018
173	"Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test" Hyunggoy Oh, Heetae Kim, Sangjun Lee, and Sungho Kang International SOC Design Conference ( ISOCC 2018 ) , NOV 2018
172	"3D Memory Formed of Unrepairable Memory Dice and Spare Layer" Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, and Sungho Kang TENCON 2018 , Oct 2018
171	"Neural Network Reliability Enhancement Approach using Dropout Underutilization in GPU" Dongsu Lee, Hyunyul Lim, Taehyun Kim, and Sungho Kang TENCON 2018 , Oct 2018
170	"A New Repair Scheme for TSV-based 3D Memory using Base Die Repair Cells" Donghyun Han, Hayoung Lee, Donghyun Kim, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
169	"An Efficient Built-in Self-Repair Scheme for Area Reduction" Keewon Cho, Young-woo Lee, Sungyoul Seo, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
168	"A Selective Error Data Capture Method using On-Chip DRAM for Silicon Debug of Multi-core Design" Hyunggoy Oh, Heetae Kim, Jaeil Lim, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
167	"Test Data Reduction Method Based on Berlekamp-Massey Algorithm" HyeonChan Lim, Junghwan Kim, Soyeon Kang, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017
166	"LARECD : Low Area overhead and Reliable Error Correction DMR architecture" Hyunyul Lim, Taehyun Kim, Dongsu Lee, and Sungho Kang International SOC Design Conference (ISOCC 2017) , September 2017

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