192

"Area Efficient Built-In Redundancy Analysis using Pre-Solutions with Various Spare Structure"
Youngki Moon, Hyunho Yoo, Donghyun Han, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
, OCT 2021

191

"Secure Scan Design through Pseudo Fault Injection"
Seokjun Jang, Hyungil Woo, Sunghoon Kim, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
, OCT 2021

190

"An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA"
Seung Ho Shin, Hayoung Lee. Younwoo Yoo, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
, OCT 2021

189

"Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory"
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, and Sungho Kang
International SOC Design Conference (ISOCC 2021)
, OCT 2021

188

"Fail Memory Configuration Set for RA Estimation"
Hayoung Lee, Keewon Cho, and Sungho Kang, Wooheon Kang, Seungtaek Lee, and Woosik Jeong
IEEE International Test Conference(ITC)
, NOV 2020

187

"Diagnosis of Scan Chain Faults Based-on Machine-Learning"
Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim and Sungho Kang
International SOC Design Conference (ISOCC 2020)
, OCT 2020

186

"Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair "
Hayoung Lee, Donghyun Han, Hogyeong Kim, and Sungho Kang
International SOC Design Conference (ISOCC 2020)
, OCT 2020

185

"Memory-like Defect Diagnosis for CMOL FPGAs"
Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, and Sungho Kang
International SOC Design Conference (ISOCC 2020)
, OCT 2020

184

"W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction"
Hayoung Lee, Donghyun Han, Hogyeong Kim and Sungho Kang
IEEE International Test Conference in Asia (ITC-Asia)
, SEP 2020