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212 |
"APAPG: Address Pre-Processed ALPG for High-Speed Linear Test"
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211 |
"Scan Architecture with Data Observation for Multiple Scan Cell Fault Diagnosis"
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210 |
"Signal Shifting-based Reusable Redundant TSV Structure for Infrastructure TSV"
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209 |
"Effective Data-Width Aware ECC Scheme for HBM"
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208 |
"LOTS: Low Overhead TSV Repair Method Using IEEE-1838 Standard Architecture"
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207 |
"GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair"
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206 |
"Machine Learning based Scan Chain Diagnosis for Double Faults"
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205 |
"A New Flip-flop Shared Architecture of Test Point Insertion for Scan Design"
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204 |
"Redundancy Analysis Simplification Scheme for High-Speed Memory Repair"
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