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116	"A New Multi-site Test for System-on-Chip using MSTAR(Multi-site Star Test ARchitecture)" Donkwan Han, Yong Lee, Sungho Kang ETRI Journal vol.36 no.2 pp.293-300, April 2014
115	"Interleaving Test Algorithm for Sub-threshold Leakage Current Defects in DRAM Considering the Equal Bit Line Stress" Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.22, no.4, pp.803-812, April 2014
114	"A novel test access mechanism for parallel testing of multi-core system" Taewoo Han, Inhyuk Choi, and Sungho Kang IEICE Electronics Express (ELEX) vol.11 no.6 pp.1-6, March 2014
113	"Dynamic thermal management for 3D multicore processors under process variations" Hyejeong Hong, Jaeil Lim, Hyunyul Lim, and Sungho Kang IEICE Electronics Express (ELEX) vol.10, no.23, pp.1-6, December 2013
112	"A Flexible Programmable Memory BIST for Embedded Single-Port Memory and Dual-Port Memory" Youngkyu Park, Hong-sik Kim, Inhyuk Choi, and Sungho Kang ETRI Journal vol.35, no.5, pp.808-818, October 2013
111	"Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations" Hyejeong Hong; Jaeil Lim; Hyunyul Lim; Sungho Kang IEICE Electronics Express (ELEX) vol.10, no.14, pp.1-6, July 2013
110	"Efficient Multi-ste Testing using ATE Channel Sharing" Kyoung-woon Eom, Dong-kwan Han, Yong Lee, Hak-song Kim and Sungho Kang Journal of Semiconductor Technology and Science (JSTS) vol.13, no.3, pp. 259-262, June, 2013
109	"A Very Efficient Redundancy Analysis Method Using Fault Grouping" Hyungjun Cho, Wooheon Kang, Sungho Kang ETRI Journal vol.35, no.3, pp.439-447, May 2013
108	"Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter" Hyejeong HONG, Sungho KANG IEICE Transactions on Communications vol.E96-B, no.2, pp. 643-646, February 2013
107	"Built-In Self-Test for Static ADC Testing with a Triangle-Wave" Incheol Kim, Sungho Kang IEICE Transactions on Electronics vol.E96-C , no.2 , pp. 292-294 , February 2013

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