109

"A Very Efficient Redundancy Analysis Method Using Fault Grouping"
Hyungjun Cho, Wooheon Kang, Sungho Kang
ETRI Journal
vol.35, no.3, pp.439-447, May 2013

108

"Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter"
Hyejeong HONG, Sungho KANG
IEICE Transactions on Communications
vol.E96-B, no.2, pp. 643-646, February 2013

107

"Built-In Self-Test for Static ADC Testing with a Triangle-Wave"
Incheol Kim, Sungho Kang
IEICE Transactions on Electronics
vol.E96-C , no.2 , pp. 292-294 , February 2013

106

"Data Randomization Scheme for Endurance Enhancement and Interference Mitigation of Multi-level Flash Memory Devices"
Jaewon Cha, and Sungho Kang
ETRI Journal
vol.35, no.1, pp.166-169, February 2013

105

"Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure"
Incheol Kim, Jaewon Jang, HyeonUk Son, Jaeseok Park, and Sungho Kang
ETRI Journal
vol.35, no.1, pp.109-119, February 2013

104

"An accurate diagnosis of transition fault clusters based on single fault simulation"
Yoseop Lim, Jaeseok Park, Sungho Kang
IEICE Electronics Express
vol.9, no.18, pp.1528-1533, October 2012

103

"High-efficiency BIRA for embedded memories with high repair rate and low area overhead"
Joohwan Lee, Kihyun Park, Sungho Kang
Journal of Semiconductor Technology and Science (JSTS)
vol.12, no.3, pp.266-269, September 2012

102

"Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards"
Dongkwan Han, Yong Lee, Sungho Kang
Journal of Semiconductor Technology and Science (JSTS)
vol.12, no.3, pp.293-296, September 2012

101

"Yield Enhancement Techniques for 3D Memories by Redundancy Sharing among All Layers"
Joohwan Lee, Kihyun Park, and Sungho Kang
ETRI Journal
vol.34, no.3, pp.388-398, June 2012

100

"A Fast Redundancy Analysis Algorithm in ATE for Repairing Faulty Memories"
Hyungjun Cho, Wooheon Kang, Sungho Kang
ETRI Journal
vol.34, no.3, pp.474-477, June 2012


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