130 |
"Fully Programmable Memory BIST for Commodity DRAMs"
|
129 |
"A New Accelerated Endurance Test for Terabit NAND Flash Memory using Interference Effect"
|
128 |
"Majority based Test Access Mechanism for Parallel Testing of Multiple Identical Cores"
|
127 |
"Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency"
|
126 |
"Multi-operation based Constrained Random Verification for On-Chip Memory"
|
125 |
"Histogram-based Calibration Method for Pipeline ADCs"
|
124 |
"Reduced-Code Test Method Using Sub-Histograms for Pipelined ADCs"
|
123 |
"A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories"
|
122 |
"A Novel Massively Parallel Testing Method using Multi-root for High Reliability"
|
121 |
"A New Thermal-Aware Voltage Island Formation for 3D Many-Core Processors"
|
|