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140	"A Low-cost DAC BIST Structure using a Resistor Loop" Jaewon Jang, Heetae Kim, Sungho Kang PLoS One vol.12, no.2, e0172331, February 2017
139	"FRESH: A New Test Result Extraction Scheme for Fast TSV Tests" Jaeseok Park, Hyunyul Lim, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.36, no.2, pp.336-345, February 2017
138	"An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time" Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang IEEE Transactions on Computers vol.66, no.1, pp.38-44, January 2017
137	"A Survey of Repair Analysis Methods for Memories" Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang ACM Computing Surveys vol.49, no.3, pp.47:1-47:41, October 2016
136	"A New 3-D Fuse Architecture to Improve Yield of 3-D Memories" Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.35, no.10, pp.1763-1767, October 2016
135	"Parallelized Network on Chip-reused Test Access Mechanism for Multiple Identical Cores" Taewoo Han, Inhyuk Choi, Hyunggoy Oh, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.35, no.7, pp.1219-1223, July 2016
134	"Optimized Built-in Self Repair for Multiple Memories" Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.24, no.6, pp.2174-2183, June 2016
133	"Tri-State Coding using Reconfiguration of Twisted Ring Counter for Test Data Compression" Sungyoul Seo, Yong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) vol.35, no.2, pp.274-284, February 2016
132	"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability" Hyejeong Hong, Jaeil Lim, Hyunyul Lim, and Sungho Kang ACM Computing Surveys vol.48, no.1, pp.9:1-9:25, September 2015
131	"3D Stacked DRAM Refresh Management with Guaranteed Data Reliability" Jaeil Lim,Hyunyul Lim, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) vol.34, no.9, pp.1455-1466, September 2015

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