107

"Built-In Self-Test for Static ADC Testing with a Triangle-Wave"
Incheol Kim, Sungho Kang
IEICE Transactions on Electronics
vol.E96-C , no.2 , pp. 292-294 , February 2013

106

"Data Randomization Scheme for Endurance Enhancement and Interference Mitigation of Multi-level Flash Memory Devices"
Jaewon Cha, and Sungho Kang
ETRI Journal
vol.35, no.1, pp.166-169, February 2013

105

"Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure"
Incheol Kim, Jaewon Jang, HyeonUk Son, Jaeseok Park, and Sungho Kang
ETRI Journal
vol.35, no.1, pp.109-119, February 2013

104

"An accurate diagnosis of transition fault clusters based on single fault simulation"
Yoseop Lim, Jaeseok Park, Sungho Kang
IEICE Electronics Express
vol.9, no.18, pp.1528-1533, October 2012

103

"High-efficiency BIRA for embedded memories with high repair rate and low area overhead"
Joohwan Lee, Kihyun Park, Sungho Kang
Journal of Semiconductor Technology and Science (JSTS)
vol.12, no.3, pp.266-269, September 2012

102

"Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards"
Dongkwan Han, Yong Lee, Sungho Kang
Journal of Semiconductor Technology and Science (JSTS)
vol.12, no.3, pp.293-296, September 2012

101

"Yield Enhancement Techniques for 3D Memories by Redundancy Sharing among All Layers"
Joohwan Lee, Kihyun Park, and Sungho Kang
ETRI Journal
vol.34, no.3, pp.388-398, June 2012

100

"A Fast Redundancy Analysis Algorithm in ATE for Repairing Faulty Memories"
Hyungjun Cho, Wooheon Kang, Sungho Kang
ETRI Journal
vol.34, no.3, pp.474-477, June 2012

99

"A method for the fast diagnosis of multiple defects using an efficient candidate selecting algorithm"
Yoseop Lim, Jaeseok Park, Sungho Kang
IEICE Electronics Express
vol.9, no.9, pp.834-839, May 2012

98

"An Efficient IP Address Lookup Algorithm Based on a Small Balanced Tree using Entry Reduction"
Hyuntae Park, Hyejeong Hong, Sungho Kang
Computer Networks
vol.56, no.1, pp.231-243, January 2012


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