137

"A Survey of Repair Analysis Methods for Memories"
Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang
ACM Computing Surveys
vol.49, no.3, pp.47:1-47:41, October 2016

136

"A New 3-D Fuse Architecture to Improve Yield of 3-D Memories"
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.35, no.10, pp.1763-1767, October 2016

135

"Parallelized Network on Chip-reused Test Access Mechanism for Multiple Identical Cores"
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.35, no.7, pp.1219-1223, July 2016

134

"Optimized Built-in Self Repair for Multiple Memories"
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.24, no.6, pp.2174-2183, June 2016

133

"Tri-State Coding using Reconfiguration of Twisted Ring Counter for Test Data Compression"
Sungyoul Seo, Yong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
vol.35, no.2, pp.274-284, February 2016

132

"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability"
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, and Sungho Kang
ACM Computing Surveys
vol.48, no.1, pp.9:1-9:25, September 2015

131

"3D Stacked DRAM Refresh Management with Guaranteed Data Reliability"
Jaeil Lim,Hyunyul Lim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
vol.34, no.9, pp.1455-1466, September 2015

130

"Fully Programmable Memory BIST for Commodity DRAMs"
Ilwoong Kim, Woosik Jeong, Dongho Kang, and Sungho Kang
ETRI Journal
vol.37, no.4, pp.787-792, August 2015

129

"A New Accelerated Endurance Test for Terabit NAND Flash Memory using Interference Effect"
Jaewon Cha and Sungho Kang
IEEE Transactions on Semiconductor Manufacturing
vol.28, no.3, pp.399-407, August 2015

128

"Majority based Test Access Mechanism for Parallel Testing of Multiple Identical Cores"
Taewoo Han, Inhyuk Choi, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.23, no.8, pp.1439-1447, August 2015


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