157

"Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost"
Inhyuk Choi, Hyunggoy Oh, Young-woo Lee, Sungho Kang
IEEE Transactions on Computers
vol.67, no.12, pp1835-1839, December 2018

156

"A Statistic-based Scan Chain Reordering for Energy-Quality Scalable Scan Test "
Sungyoul Seo, Keewon Cho, Young-woo Lee, Sungho Kang
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
vol.8, no.3, pp 391-403, September 2018

155

"A debug scheme to improve the error identification in post-silicon validation"
Inhyuk Choi, Won Jung, Hyunggoy Oh, Sungho Kang
PLoS One
vol.13, no.9, e0202216, September 2018

154

"Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis"
Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.37, no.7, pp.1473-1482, July 2018

153

"Thermal Aware Test Scheduling for NTV Circuit "
Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.37, no.4, pp.906-910, March 2018

152

"Fast Built-in Redundancy Analysis Based on Sequential Spare Line Allocation"
Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang
IEEE Transactions on Reliability
vol.67, no.1, pp.264-273, March 2018

151

"An Area-efficient BIRA with 1D Spare Segments"
Donghyun Kim, Hayoung Lee, Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.26, no.1, pp.206-210, January 2018

150

"A novel X-filling method for capture power reduction"
Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang
IEICE Electronics Express (ELEX)
vol.14, no.23, pp.1-6, November 2017

149

"Grouping-based TSV Test Architecture for Resistive Open and Bridge Defects in 3D-ICs"
Young-woo Lee, Hyeonchan Lim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.36, no.10, pp.1759-1763, October 2017

148

"DRAM-based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores"
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
IEEE Transactions on Computers
vol.66, no.9, pp.1504-1517, September 2017


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