211

"A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing"
Juyong Lee, Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.3, pp.867-871, March 2025

210

"An Efficient Low Power BIST for Automotive SoC with Periodic Pattern Type Selection"
Jongho Park, Sangjun Lee, Hyemin Kim, Jaeyoung Joung, Jaehyun Kim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.3, pp.1169-1179, March 2025

209

"Low Cost TSV Repair Architecture Using Switch-Based Matrix for Highly Clustered Faults"
Seokjun Jang, Donghyun Han, Sunghoon Kim, Dayoung Kim, and Sungho Kang
IEEE Access
vol.13, pp.30722-30731, February 2025

208

"A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM"
Youngki Moon, Seung Ho Shin, Seokjun Jang, Duyeon Won, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.2, pp.488-498, February 2025

207

"Effective Parallel Redundancy Analysis Using GPU for Memory Repair"
Seung Ho Shin, Hayoung Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.2, pp.462-474, February 2025

206

"A New Pipelined Output Data Reducer of BOST for Improved Parallelism"
Sooryeong Lee, Hayoung Lee, Juyong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.2, pp.765-776, February 2025

205

"RAPID Redundancy Analysis with Parallelized and Intelligent Distribution"
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, and Sungho Kang
IEEE Access
vol. 13, pp. 2089-2100, January 2025

204

"PASS: Pattern-Sequence-Authentication-based Secure Scan against Reverse Engineering Attacks"
Seokjun Jang, Youngki Moon, Duyeon Won, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.1, pp.52-64, January 2025

203

"PETRA: Powerful Early Termination based Redundancy Analysis"
Youngkwang Lee, Hyojoon Yun, Younwoo Yoo, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.1, pp.345-356, January 2025

202

"An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Data"
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Doohyun Yoon, Sungho Kang
IEEE Access
vol.12, pp.146463 - 146475, October 2024


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