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70	"ATPG-XP: Test Generation for Maximal Crosstalk-induced Faults" Sunghoon Chun, Taejin Kim and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol. 28, no. 9, pp. 1401-1413, September 2009
69	"Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time" Yongjoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park and Sungho Kang IEICE Transactions on Information and Systems vol. E92-D, no. 7, pp. 1462-1465, July 2009
68	"A Novel BIRA Method for Both High Repair Efficiency and Small Hardware Overhead" Myung-Hoon Yang, Hyungjun Cho, Woosik Jeong, and Sungho Kang ETRI Journal vol. 31, no. 3, pp. 339-341, June 2009
67	"An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR" Myung-Hoon Yang, Yongjoon Kim, Sunghoon Chun and Sungho Kang Journal of Electronic Testing:Theory and Applications vol. 24, pp. 591-595, December 2008
66	"Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor using Dynamic Voltage Scaling Efficiency Metric" Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Jin-Ho Ahn and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol. 27, no. 11, pp. 2088-2092, November 2008
65	"Ant colony based efficient triplet calculation methodology for arithmetic built-in self test" Hong-Sik Kim, Hyunjin Kim, and Sungho Kang IEICE Electronics Express vol. 5, no. 20, pp. 877-881, October 2008
64	"A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals" Youbean Kim, Kicheol Kim, Incheol Kim and Sungho Kang IEICE Transactions on Electronics vol. E91-C, no. 10, pp. 1713-1716, October 2008
63	"Growth of Transparent nc-InGaO3(ZnO)2 Thin Films with Indium mol Ratios Using Solution Process" Kyung Ho Kim, Gun Hee Kim, Hyun Soo Shin, Byung Du Ahn, Sungho Kang, and Hyun Jae Kim Journal of the Electrochemical Society vol. 155, no. 11, pp. H848-H851, September 2008
62	"An Effective Test and Diagnosis Algorithm for Dual-Port Memories" Youngkyu Park, Myung-Hoon Yang, Yongjoon Kim, Dae-Yeal Lee, and Sungho Kang ETRI Journal vol. 30, no. 4, pp. 555-564, August 2008
61	"A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment" Hongsik Kim, Sungho Kang and Michael S. Hsiao Journal of Electronic Testing : Theory and Applications vol. 24, no. 4, pp. 365-378, August 2008

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