"An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR"
Myung-Hoon Yang, Yongjoon Kim, Sunghoon Chun and Sungho Kang
Journal of Electronic Testing:Theory and Applications
vol. 24, pp. 591-595, December 2008


"Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor using Dynamic Voltage Scaling Efficiency Metric"
Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Jin-Ho Ahn and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol. 27, no. 11, pp. 2088-2092, November 2008


"Ant colony based efficient triplet calculation methodology for arithmetic built-in self test"
Hong-Sik Kim, Hyunjin Kim, and Sungho Kang
IEICE Electronics Express
vol. 5, no. 20, pp. 877-881, October 2008


"A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals"
Youbean Kim, Kicheol Kim, Incheol Kim and Sungho Kang
IEICE Transactions on Electronics
vol. E91-C, no. 10, pp. 1713-1716, October 2008


"Growth of Transparent nc-InGaO3(ZnO)2 Thin Films with Indium mol Ratios Using Solution Process"
Kyung Ho Kim, Gun Hee Kim, Hyun Soo Shin, Byung Du Ahn, Sungho Kang, and Hyun Jae Kim
Journal of the Electrochemical Society
vol. 155, no. 11, pp. H848-H851, September 2008


"An Effective Test and Diagnosis Algorithm for Dual-Port Memories"
Youngkyu Park, Myung-Hoon Yang, Yongjoon Kim, Dae-Yeal Lee, and Sungho Kang
ETRI Journal
vol. 30, no. 4, pp. 555-564, August 2008


"A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment"
Hongsik Kim, Sungho Kang and Michael S. Hsiao
Journal of Electronic Testing : Theory and Applications
vol. 24, no. 4, pp. 365-378, August 2008


"A New Scan Partition Scheme for Low-Power Embedded Systems"
Hong-Sik Kim, Cheong-Ghil Kim and Sungho Kang
ETRI Journal
vol. 30, no. 3, pp. 412-420, June 2008


"High-efficiency memory BISR with two serial RA stages using spare memories"
Ilkwon Kang, Woosik Jeong and Sungho Kang
IEE Electronics Letters
vol. 44, no. 8, pp. 515-517, April 2008


"A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-random Logic BIST"
Youbean Kim, Kicheol Kim, Incheol Kim, HyeonUk Son and Sungho Kang
IEICE Information and Systems
vol. E01-D, no. 4, pp. 1185-1188, April 2008

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