|
110 |
"Efficient Multi-ste Testing using ATE Channel Sharing"
|
|
109 |
"A Very Efficient Redundancy Analysis Method Using Fault Grouping"
|
|
108 |
"Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter"
|
|
107 |
"Built-In Self-Test for Static ADC Testing with a Triangle-Wave"
|
|
106 |
"Data Randomization Scheme for Endurance Enhancement and Interference Mitigation of Multi-level Flash Memory Devices"
|
|
105 |
"Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure"
|
|
104 |
"An accurate diagnosis of transition fault clusters based on single fault simulation"
|
|
103 |
"High-efficiency BIRA for embedded memories with high repair rate and low area overhead"
|
|
102 |
"Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards"
|
|
101 |
"Yield Enhancement Techniques for 3D Memories by Redundancy Sharing among All Layers"
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|
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