188

"Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture"
Youngkwang Lee, Donghyun Han, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be published,

187

"A Hybrid Test Scheme for Automotive IC in Multi-site Testing"
Hyeonchan Lim, Hyojoon Yun, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be published,

186

"SPAR: A New Test Point Insertion Using Shared Points for Area Overhead Reduction"
Gyungbin Kim, Minho Cheong, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be published,

185

"Multi-Bank Optimized Redundancy Analysis Using Efficient Fault Collection"
Hogyeong Kim, Hayoung Lee, Donghyun Han, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be published,

184

"ECMO: ECC Architecture Reusing Content Addressable Memories for Obtaining High Reliability in DRAM"
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.30, no.6, pp.781-793, June 2022

183

"Herringbone Based TSV Architecture for Clustered Fault Repair and Aging Recovery"
Sangmin Park, Minho Cheong, Donghyun Han, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.41, no.4, pp.1142-1153, April 2022

182

"Reduced-Pin-Count BOST for Test-Cost Reduction"
Youngkwang Lee, Young-woo Lee, Sungyoul Seo, Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.41, no.3, pp.750-761, March 2022

181

"ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory"
Donghyun Han, Hayoung Lee, Seungtaek Lee, and Sungho Kang
IEEE Access
vol.9, pp.133274-133288, October 2021

180

"Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks"
Sangjun Lee, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, and Sungho Kang
Sensors
vol.21, no.18, pp.6111, September 2021

179

"Reconfigurable Scan Architecture for High Diagnostic Resolution"
Seokjun Jang, Jihye Kim, Sungho Kang
IEEE Access
vol.9, pp.120537-120550, August 2021


[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] Next Page>>