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46 |
"MICRO:A New Hybrid Test Data Compression/Decompression Scheme"
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45 |
"Increasing Encording Efficiency of LFSR Reseeding Based Test Compression"
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44 |
"An Efficient Dictionary Organization for Maximum Diagnosis"
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43 |
"A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets"
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42 |
"Efficient BIST scheme for A/D converters"
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41 |
"A Practical Test Scheduling using Network-Based TAM in Network on Chip Architecture"
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40 |
"Increasing Embedding Probabilities of RPRPs in RIN Based BIST"
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39 |
"A New Low Power Test Pattern Generator for BIST Architecture"
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38 |
"An Efficient Parallel Architecture Using Register-in-Logic Element for Digital Signal Processing"
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37 |
"An Effective Built-In Self-Test for Chargepump PLL"
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