44 |
"An Efficient Dictionary Organization for Maximum Diagnosis"
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43 |
"A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets"
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42 |
"Efficient BIST scheme for A/D converters"
|
41 |
"A Practical Test Scheduling using Network-Based TAM in Network on Chip Architecture"
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40 |
"Increasing Embedding Probabilities of RPRPs in RIN Based BIST"
|
39 |
"A New Low Power Test Pattern Generator for BIST Architecture"
|
38 |
"An Efficient Parallel Architecture Using Register-in-Logic Element for Digital Signal Processing"
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37 |
"An Effective Built-In Self-Test for Chargepump PLL"
|
36 |
"An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications"
|
35 |
"Code-Width Testing Based Compact ADC BIST (Built-In Self-Test) Circuit"
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