54

"A New Analog-to-Digital Converter BIST Considering a Transient Zone"
Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son and Sungho Kang
IEICE Transactions on Electronics
vol. E90-C, no. 11, pp. 2161-2163, November 2007

53

"Double component long period waveguide grating filter in sol-gel material"
Abderrafia Moujoud, Hyun Jae Kim, Sung Ho Kang, Gyong-Jin Oh, Woo-Soo Kim, Byeong-Soo Bae, Sang-Yung Shin
OPTICS EXPRESS
vol 15, no. 23, pp. 15147-15153, November 2007

52

"MDSI : Signal Integrity Interconnect Fault Modeling and Testing for SoCs"
Sunghoon Chun, Yongjoon Kim and Sungho Kang
Journal of Electronic Testing: Theory and Applications
vol. 23, pp. 357-362, August 2007

51

"Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing"
Myung-Hoon Yang, Yongjoon Kim, Youngkyu Park, Daeyeal Lee and Sungho Kang
IET Computers & Digital Techniques
vol 1, no. 4, pp. 369-376, July 2007

50

"Test Scheduling of NoC-Based SoCs Using Multiple Test Clocks"
Jin-Ho Ahn, and Sungho Kang
ETRI Journal
vol 28, no. 4, pp. 475-485, August 2006

49

"SoC Test Scheduling Algorithm Using ACO-Based Rectangle Packing"
Jin-Ho Ahn, and Sungho Kang
Lecture Notes on Computer Science
vol. 4114, pp. 655-660, August 2006

48

"System on a Chip Implementation of Social Insect Behavior for Adaptive Network Routing"
Jin-Ho Ahn, Hyunjin Kim, Byung In Moon, and Sungho Kang
Lecture Notes on Computer Science
vol. 4114, pp. 530-535, August 2006

47

"IOC-LP: Hybrid Test Data Compression/Decompression Scheme for Low Power Testing"
Sunghoon Chun, YongJoon Kim, Myunghoon Yang, Sungho Kang
IEE Proceedings Circuits, Devices &Systems
vol. 153, issue 4, pp. 391-398, August 2006

46

"MICRO:A New Hybrid Test Data Compression/Decompression Scheme"
Sunghoon Chun, YongJoon Kim, Jung-Been Im and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol. 14, issue 6, pp. 649-654, June 2006

45

"Increasing Encording Efficiency of LFSR Reseeding Based Test Compression"
Hong-Sik Kim, Sungho Kang
IEEE Transactions on CAD
vol.25, no.5, pp. 913-917, May 2006


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