54 |
"A New Analog-to-Digital Converter BIST Considering a Transient Zone"
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53 |
"Double component long period waveguide grating filter in sol-gel material"
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52 |
"MDSI : Signal Integrity Interconnect Fault Modeling and Testing for SoCs"
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51 |
"Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing"
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50 |
"Test Scheduling of NoC-Based SoCs Using Multiple Test Clocks"
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49 |
"SoC Test Scheduling Algorithm Using ACO-Based Rectangle Packing"
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48 |
"System on a Chip Implementation of Social Insect Behavior for Adaptive Network Routing"
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47 |
"IOC-LP: Hybrid Test Data Compression/Decompression Scheme for Low Power Testing"
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46 |
"MICRO:A New Hybrid Test Data Compression/Decompression Scheme"
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45 |
"Increasing Encording Efficiency of LFSR Reseeding Based Test Compression"
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