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59	"High-efficiency memory BISR with two serial RA stages using spare memories" Ilkwon Kang, Woosik Jeong and Sungho Kang IEE Electronics Letters vol. 44, no. 8, pp. 515-517, April 2008
58	"A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-random Logic BIST" Youbean Kim, Kicheol Kim, Incheol Kim, HyeonUk Son and Sungho Kang IEICE Information and Systems vol. E01-D, no. 4, pp. 1185-1188, April 2008
57	"MTR-fill : A Simulated Annealing-based X-filling Technique to Reduce Test Power Dissipation for Scan-Based Designs" Dongsup Song, Jinho Ahn, Taejin Kim and Sungho Kang IEICE Transactions on Information and Systems vol. E91-D, no. 4, pp. 1197-1200, April 2008
56	"A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters" Kicheol Kim, Youbean Kim, Heyeonuk Son and Sungho Kang IEICE Transactions on Electronics vol. E91-C, no. 4, pp. 670-672, April 2008
55	"NoC-Based SoC Test Scheduling Using Ant Colony Optimization" Jinho Ahn and Sungho Kang ETRI Journal vol. 30, no. 1, pp. 129-140, February 2008
54	"A New Analog-to-Digital Converter BIST Considering a Transient Zone" Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son and Sungho Kang IEICE Transactions on Electronics vol. E90-C, no. 11, pp. 2161-2163, November 2007
53	"Double component long period waveguide grating filter in sol-gel material" Abderrafia Moujoud, Hyun Jae Kim, Sung Ho Kang, Gyong-Jin Oh, Woo-Soo Kim, Byeong-Soo Bae, Sang-Yung Shin OPTICS EXPRESS vol 15, no. 23, pp. 15147-15153, November 2007
52	"MDSI : Signal Integrity Interconnect Fault Modeling and Testing for SoCs" Sunghoon Chun, Yongjoon Kim and Sungho Kang Journal of Electronic Testing: Theory and Applications vol. 23, pp. 357-362, August 2007
51	"Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing" Myung-Hoon Yang, Yongjoon Kim, Youngkyu Park, Daeyeal Lee and Sungho Kang IET Computers & Digital Techniques vol 1, no. 4, pp. 369-376, July 2007
50	"Test Scheduling of NoC-Based SoCs Using Multiple Test Clocks" Jin-Ho Ahn, and Sungho Kang ETRI Journal vol 28, no. 4, pp. 475-485, August 2006

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