|
69 |
"Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time"
|
|
68 |
"A Novel BIRA Method for Both High Repair Efficiency and Small Hardware Overhead"
|
|
67 |
"An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR"
|
|
66 |
"Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor using Dynamic Voltage Scaling Efficiency Metric"
|
|
65 |
"Ant colony based efficient triplet calculation methodology for arithmetic built-in self test"
|
|
64 |
"A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals"
|
|
63 |
"Growth of Transparent nc-InGaO3(ZnO)2 Thin Films with Indium mol Ratios Using Solution Process"
|
|
62 |
"An Effective Test and Diagnosis Algorithm for Dual-Port Memories"
|
|
61 |
"A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment"
|
|
60 |
"A New Scan Partition Scheme for Low-Power Embedded Systems"
|
|
<< Previous Page |