64

"A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals"
Youbean Kim, Kicheol Kim, Incheol Kim and Sungho Kang
IEICE Transactions on Electronics
vol. E91-C, no. 10, pp. 1713-1716, October 2008

63

"Growth of Transparent nc-InGaO3(ZnO)2 Thin Films with Indium mol Ratios Using Solution Process"
Kyung Ho Kim, Gun Hee Kim, Hyun Soo Shin, Byung Du Ahn, Sungho Kang, and Hyun Jae Kim
Journal of the Electrochemical Society
vol. 155, no. 11, pp. H848-H851, September 2008

62

"An Effective Test and Diagnosis Algorithm for Dual-Port Memories"
Youngkyu Park, Myung-Hoon Yang, Yongjoon Kim, Dae-Yeal Lee, and Sungho Kang
ETRI Journal
vol. 30, no. 4, pp. 555-564, August 2008

61

"A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment"
Hongsik Kim, Sungho Kang and Michael S. Hsiao
Journal of Electronic Testing : Theory and Applications
vol. 24, no. 4, pp. 365-378, August 2008

60

"A New Scan Partition Scheme for Low-Power Embedded Systems"
Hong-Sik Kim, Cheong-Ghil Kim and Sungho Kang
ETRI Journal
vol. 30, no. 3, pp. 412-420, June 2008

59

"High-efficiency memory BISR with two serial RA stages using spare memories"
Ilkwon Kang, Woosik Jeong and Sungho Kang
IEE Electronics Letters
vol. 44, no. 8, pp. 515-517, April 2008

58

"A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-random Logic BIST"
Youbean Kim, Kicheol Kim, Incheol Kim, HyeonUk Son and Sungho Kang
IEICE Information and Systems
vol. E01-D, no. 4, pp. 1185-1188, April 2008

57

"MTR-fill : A Simulated Annealing-based X-filling Technique to Reduce Test Power Dissipation for Scan-Based Designs"
Dongsup Song, Jinho Ahn, Taejin Kim and Sungho Kang
IEICE Transactions on Information and Systems
vol. E91-D, no. 4, pp. 1197-1200, April 2008

56

"A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters"
Kicheol Kim, Youbean Kim, Heyeonuk Son and Sungho Kang
IEICE Transactions on Electronics
vol. E91-C, no. 4, pp. 670-672, April 2008

55

"NoC-Based SoC Test Scheduling Using Ant Colony Optimization"
Jinho Ahn and Sungho Kang
ETRI Journal
vol. 30, no. 1, pp. 129-140, February 2008


<< Previous Page [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] Next Page>>