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76	"Photosensitive terpolymer for all-wet-etching process: Material characterization and device fabrication" Abderrafia Moujoud, Sungho Kang, Hyun Jae Kim, and Mark Andrews Thin Solid Films vol.518 , no.8 , pp. 2147-2151, Feb. 2010
75	"A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption" Yongjoon Kim, Jaeseok Park, and Sungho Kang IEICE Transactions on Information and Systems vol. E93-D, no. 1 , pp. 193-196, January 2010
74	"A Memory Efficient Parallel String Matching for Intrustion Detection Systems" HyunJin Kim, Hyejeong Hong, Hong-Sik Kim, and Sungho Kang IEEE Communication Letters vol. 13, no. 12, pp. 1004-1006, December 2009
73	"An Effective Programmable Memory BIST for Embedded Memory" Youngkyu Park, Jaeseok Park,taewoo han, and Sungho Kang IEICE Transactions on Information and Systems vol. E92-D, no. 12, pp.2508-2511, December 2009
72	"A Fast Built-in Redundancy Analysis for Memories with Optimal Repair rate Using a Line-based Search Tree" Woosik Jeong, Ilkwon Kang, Kyowon Jin and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol. 17, no. 12, pp. 1665-1678, December 2009
71	"Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume" Yongjoon Kim, Jaeseok Park, and Sungho Kang IEICE Electronics Express vol. 6, no. 20, pp. 1432-1437, October 2009
70	"ATPG-XP: Test Generation for Maximal Crosstalk-induced Faults" Sunghoon Chun, Taejin Kim and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol. 28, no. 9, pp. 1401-1413, September 2009
69	"Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time" Yongjoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park and Sungho Kang IEICE Transactions on Information and Systems vol. E92-D, no. 7, pp. 1462-1465, July 2009
68	"A Novel BIRA Method for Both High Repair Efficiency and Small Hardware Overhead" Myung-Hoon Yang, Hyungjun Cho, Woosik Jeong, and Sungho Kang ETRI Journal vol. 31, no. 3, pp. 339-341, June 2009
67	"An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR" Myung-Hoon Yang, Yongjoon Kim, Sunghoon Chun and Sungho Kang Journal of Electronic Testing:Theory and Applications vol. 24, pp. 591-595, December 2008

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