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79	"Pattern mapping method for low power BIST based on transition freezing method" Youbean Kim, Jaewon Jang, Hyunwook Son and Sungho Kang IEICE Transactions on Information and Systems vol. E93-D, no. 3, pp. 643-646, March 2010
78	"Selective Scan Slice Grouping Technique for Efficient Test Data Compression" Yongjoon Kim, Jaeseok Park, and Sungho Kang IEICE Transactions on Information and Systems vol. E93-D, no. 2, pp. 380-383, Feburary 2010
77	"A memory-efficient pattern matching with hardware - based bit-split string matchers for deep packet inspection" HyunJin KIM, Hong-Sik KIM, Jung-Hee LEE, Jin-Ho AHN and Sungho Kang IEICE Transactions on Communications vol. E93-B, no. 2, pp. 396-398, Feburary 2010
76	"Photosensitive terpolymer for all-wet-etching process: Material characterization and device fabrication" Abderrafia Moujoud, Sungho Kang, Hyun Jae Kim, and Mark Andrews Thin Solid Films vol.518 , no.8 , pp. 2147-2151, Feb. 2010
75	"A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption" Yongjoon Kim, Jaeseok Park, and Sungho Kang IEICE Transactions on Information and Systems vol. E93-D, no. 1 , pp. 193-196, January 2010
74	"A Memory Efficient Parallel String Matching for Intrustion Detection Systems" HyunJin Kim, Hyejeong Hong, Hong-Sik Kim, and Sungho Kang IEEE Communication Letters vol. 13, no. 12, pp. 1004-1006, December 2009
73	"An Effective Programmable Memory BIST for Embedded Memory" Youngkyu Park, Jaeseok Park,taewoo han, and Sungho Kang IEICE Transactions on Information and Systems vol. E92-D, no. 12, pp.2508-2511, December 2009
72	"A Fast Built-in Redundancy Analysis for Memories with Optimal Repair rate Using a Line-based Search Tree" Woosik Jeong, Ilkwon Kang, Kyowon Jin and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol. 17, no. 12, pp. 1665-1678, December 2009
71	"Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume" Yongjoon Kim, Jaeseok Park, and Sungho Kang IEICE Electronics Express vol. 6, no. 20, pp. 1432-1437, October 2009
70	"ATPG-XP: Test Generation for Maximal Crosstalk-induced Faults" Sunghoon Chun, Taejin Kim and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol. 28, no. 9, pp. 1401-1413, September 2009

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