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105	"Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure" Incheol Kim, Jaewon Jang, HyeonUk Son, Jaeseok Park, and Sungho Kang ETRI Journal vol.35, no.1, pp.109-119, February 2013
104	"An accurate diagnosis of transition fault clusters based on single fault simulation" Yoseop Lim, Jaeseok Park, Sungho Kang IEICE Electronics Express vol.9, no.18, pp.1528-1533, October 2012
103	"High-efficiency BIRA for embedded memories with high repair rate and low area overhead" Joohwan Lee, Kihyun Park, Sungho Kang Journal of Semiconductor Technology and Science (JSTS) vol.12, no.3, pp.266-269, September 2012
102	"Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards" Dongkwan Han, Yong Lee, Sungho Kang Journal of Semiconductor Technology and Science (JSTS) vol.12, no.3, pp.293-296, September 2012
101	"Yield Enhancement Techniques for 3D Memories by Redundancy Sharing among All Layers" Joohwan Lee, Kihyun Park, and Sungho Kang ETRI Journal vol.34, no.3, pp.388-398, June 2012
100	"A Fast Redundancy Analysis Algorithm in ATE for Repairing Faulty Memories" Hyungjun Cho, Wooheon Kang, Sungho Kang ETRI Journal vol.34, no.3, pp.474-477, June 2012
99	"A method for the fast diagnosis of multiple defects using an efficient candidate selecting algorithm" Yoseop Lim, Jaeseok Park, Sungho Kang IEICE Electronics Express vol.9, no.9, pp.834-839, May 2012
98	"An Efficient IP Address Lookup Algorithm Based on a Small Balanced Tree using Entry Reduction" Hyuntae Park, Hyejeong Hong, Sungho Kang Computer Networks vol.56, no.1, pp.231-243, January 2012
97	"A Die-Selection Method Using Search-Space Conditions for Yield Enhancement in 3D Memory" Joohwan Lee, Kihyun Park, Sungho Kang ETRI Journal vol.33, no.6, pp.904-913, December 2011
96	"An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector" Hyuntae Park, Hyejeong Hong, Sungho Kang IEICE Transactions on Communications Vol.E94-B,No.11,pp.3128-3131, November 2011

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