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109	"A Very Efficient Redundancy Analysis Method Using Fault Grouping" Hyungjun Cho, Wooheon Kang, Sungho Kang ETRI Journal vol.35, no.3, pp.439-447, May 2013
108	"Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter" Hyejeong HONG, Sungho KANG IEICE Transactions on Communications vol.E96-B, no.2, pp. 643-646, February 2013
107	"Built-In Self-Test for Static ADC Testing with a Triangle-Wave" Incheol Kim, Sungho Kang IEICE Transactions on Electronics vol.E96-C , no.2 , pp. 292-294 , February 2013
106	"Data Randomization Scheme for Endurance Enhancement and Interference Mitigation of Multi-level Flash Memory Devices" Jaewon Cha, and Sungho Kang ETRI Journal vol.35, no.1, pp.166-169, February 2013
105	"Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure" Incheol Kim, Jaewon Jang, HyeonUk Son, Jaeseok Park, and Sungho Kang ETRI Journal vol.35, no.1, pp.109-119, February 2013
104	"An accurate diagnosis of transition fault clusters based on single fault simulation" Yoseop Lim, Jaeseok Park, Sungho Kang IEICE Electronics Express vol.9, no.18, pp.1528-1533, October 2012
103	"High-efficiency BIRA for embedded memories with high repair rate and low area overhead" Joohwan Lee, Kihyun Park, Sungho Kang Journal of Semiconductor Technology and Science (JSTS) vol.12, no.3, pp.266-269, September 2012
102	"Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards" Dongkwan Han, Yong Lee, Sungho Kang Journal of Semiconductor Technology and Science (JSTS) vol.12, no.3, pp.293-296, September 2012
101	"Yield Enhancement Techniques for 3D Memories by Redundancy Sharing among All Layers" Joohwan Lee, Kihyun Park, and Sungho Kang ETRI Journal vol.34, no.3, pp.388-398, June 2012
100	"A Fast Redundancy Analysis Algorithm in ATE for Repairing Faulty Memories" Hyungjun Cho, Wooheon Kang, Sungho Kang ETRI Journal vol.34, no.3, pp.474-477, June 2012

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