104 |
"An accurate diagnosis of transition fault clusters based on single fault simulation"
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103 |
"High-efficiency BIRA for embedded memories with high repair rate and low area overhead"
|
102 |
"Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards"
|
101 |
"Yield Enhancement Techniques for 3D Memories by Redundancy Sharing among All Layers"
|
100 |
"A Fast Redundancy Analysis Algorithm in ATE for Repairing Faulty Memories"
|
99 |
"A method for the fast diagnosis of multiple defects using an efficient candidate selecting algorithm"
|
98 |
"An Efficient IP Address Lookup Algorithm Based on a Small Balanced Tree using Entry Reduction"
|
97 |
"A Die-Selection Method Using Search-Space Conditions for Yield Enhancement in 3D Memory"
|
96 |
"An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector"
|
95 |
"A Memory-Efficient Bit-Split Parallel String Matching using Pattern Dividing for Intrusion Detection Systems"
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