114

"A novel test access mechanism for parallel testing of multi-core system"
Taewoo Han, Inhyuk Choi, and Sungho Kang
IEICE Electronics Express (ELEX)
vol.11 no.6 pp.1-6, March 2014

113

"Dynamic thermal management for 3D multicore processors under process variations"
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, and Sungho Kang
IEICE Electronics Express (ELEX)
vol.10, no.23, pp.1-6, December 2013

112

"A Flexible Programmable Memory BIST for Embedded Single-Port Memory and Dual-Port Memory"
Youngkyu Park, Hong-sik Kim, Inhyuk Choi, and Sungho Kang
ETRI Journal
vol.35, no.5, pp.808-818, October 2013

111

"Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations"
Hyejeong Hong; Jaeil Lim; Hyunyul Lim; Sungho Kang
IEICE Electronics Express (ELEX)
vol.10, no.14, pp.1-6, July 2013

110

"Efficient Multi-ste Testing using ATE Channel Sharing"
Kyoung-woon Eom, Dong-kwan Han, Yong Lee, Hak-song Kim and Sungho Kang
Journal of Semiconductor Technology and Science (JSTS)
vol.13, no.3, pp. 259-262, June, 2013

109

"A Very Efficient Redundancy Analysis Method Using Fault Grouping"
Hyungjun Cho, Wooheon Kang, Sungho Kang
ETRI Journal
vol.35, no.3, pp.439-447, May 2013

108

"Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter"
Hyejeong HONG, Sungho KANG
IEICE Transactions on Communications
vol.E96-B, no.2, pp. 643-646, February 2013

107

"Built-In Self-Test for Static ADC Testing with a Triangle-Wave"
Incheol Kim, Sungho Kang
IEICE Transactions on Electronics
vol.E96-C , no.2 , pp. 292-294 , February 2013

106

"Data Randomization Scheme for Endurance Enhancement and Interference Mitigation of Multi-level Flash Memory Devices"
Jaewon Cha, and Sungho Kang
ETRI Journal
vol.35, no.1, pp.166-169, February 2013

105

"Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure"
Incheol Kim, Jaewon Jang, HyeonUk Son, Jaeseok Park, and Sungho Kang
ETRI Journal
vol.35, no.1, pp.109-119, February 2013