139

"FRESH: A New Test Result Extraction Scheme for Fast TSV Tests"
Jaeseok Park, Hyunyul Lim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.36, no.2, pp.336-345, February 2017

138

"An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time"
Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang
IEEE Transactions on Computers
vol.66, no.1, pp.38-44, January 2017

137

"A Survey of Repair Analysis Methods for Memories"
Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang
ACM Computing Surveys
vol.49, no.3, pp.47:1-47:41, October 2016

136

"A New 3-D Fuse Architecture to Improve Yield of 3-D Memories"
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.35, no.10, pp.1763-1767, October 2016

135

"Parallelized Network on Chip-reused Test Access Mechanism for Multiple Identical Cores"
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.35, no.7, pp.1219-1223, July 2016

134

"Optimized Built-in Self Repair for Multiple Memories"
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.24, no.6, pp.2174-2183, June 2016

133

"Tri-State Coding using Reconfiguration of Twisted Ring Counter for Test Data Compression"
Sungyoul Seo, Yong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
vol.35, no.2, pp.274-284, February 2016

132

"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability"
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, and Sungho Kang
ACM Computing Surveys
vol.48, no.1, pp.9:1-9:25, September 2015

131

"3D Stacked DRAM Refresh Management with Guaranteed Data Reliability"
Jaeil Lim,Hyunyul Lim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
vol.34, no.9, pp.1455-1466, September 2015

130

"Fully Programmable Memory BIST for Commodity DRAMs"
Ilwoong Kim, Woosik Jeong, Dongho Kang, and Sungho Kang
ETRI Journal
vol.37, no.4, pp.787-792, August 2015