134 |
"Optimized Built-in Self Repair for Multiple Memories"
|
133 |
"Tri-State Coding using Reconfiguration of Twisted Ring Counter for Test Data Compression"
|
132 |
"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability"
|
131 |
"3D Stacked DRAM Refresh Management with Guaranteed Data Reliability"
|
130 |
"Fully Programmable Memory BIST for Commodity DRAMs"
|
129 |
"A New Accelerated Endurance Test for Terabit NAND Flash Memory using Interference Effect"
|
128 |
"Majority based Test Access Mechanism for Parallel Testing of Multiple Identical Cores"
|
127 |
"Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency"
|
126 |
"Multi-operation based Constrained Random Verification for On-Chip Memory"
|
125 |
"Histogram-based Calibration Method for Pipeline ADCs"
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